Semiconductor device including substrate contact and related method
First Claim
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1. A method of forming a contact on a semiconductor device, the method comprising:
- forming a mask on the semiconductor device, the mask exposing at least one contact region including a polysilicon node disposed in a trench of a substrate of the semiconductor device;
performing a first substrate contact etch on the semiconductor device, the first substrate contact etch recessing the polysilicon node within the trench;
removing a set of node films disposed about the polysilicon node and on the sides of the trench, wherein the set of node films include at least two films that extend below the polysilicon node, the polysilicon node being disposed entirely within the substrate and the set of node films; and
forming a contact region within the trench to the substrate and completely covering a top surface of the polysilicon node.
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Abstract
A method of forming a contact on a semiconductor device is disclosed. The method includes: forming a mask on the semiconductor device, the mask exposing at least one contact node disposed within a trench in a substrate of the semiconductor device; performing a first substrate contact etch on the semiconductor device, the first substrate contact etch recessing the exposed contact node within the trench;
removing a set of node films disposed above the exposed contact node and on the sides of the trench; and forming a contact region within the trench above the exposed contact node, the contact region contacting the substrate.
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Citations
18 Claims
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1. A method of forming a contact on a semiconductor device, the method comprising:
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forming a mask on the semiconductor device, the mask exposing at least one contact region including a polysilicon node disposed in a trench of a substrate of the semiconductor device; performing a first substrate contact etch on the semiconductor device, the first substrate contact etch recessing the polysilicon node within the trench; removing a set of node films disposed about the polysilicon node and on the sides of the trench, wherein the set of node films include at least two films that extend below the polysilicon node, the polysilicon node being disposed entirely within the substrate and the set of node films; and forming a contact region within the trench to the substrate and completely covering a top surface of the polysilicon node. - View Dependent Claims (2, 3, 4, 5, 6)
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7. A method of forming a contact on a semiconductor device, the method comprising:
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forming a mask on the semiconductor device, the semiconductor device including a set of polysilicon contact nodes and the mask exposing at least one polysilicon contact node disposed within a trench in a substrate of the semiconductor device; performing a first substrate contact etch on the semiconductor device, the first substrate contact etch recessing the at least one exposed polysilicon contact node within the trench; removing the mask from the semiconductor device; performing a second substrate contact etch on the semiconductor device, the second substrate contact etch recessing the set of polysilicon contact nodes within the semiconductor device; removing a set of node films disposed above the set of polysilicon contact nodes and on the sides of the trench, wherein the set of node films include at least two films that extend below the polysilicon contact node, the polysilicon contact node being disposed entirely within the substrate and the set of node films; and forming a contact region within the trench above the set of polysilicon contact nodes and completely covering a top surface of the set of polysilicon contact nodes. - View Dependent Claims (8, 9, 10, 11, 12)
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13. A method of forming a contact on a semiconductor device, the method comprising:
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masking regions of the semiconductor device other than a set of substrate contacts, the set of substrate contacts including a set of polysilicon contact nodes disposed within a trench in a substrate of the semiconductor device; etching about the set of substrate contacts on the semiconductor device; removing a portion of the set of polysilicon contact nodes from the trench; and removing a set of node films disposed above the set of polysilicon contact nodes and on the sides of the trench following the etching, wherein the set of node films include at least two films that extend below at least one of the set of polysilicon contact nodes, the at least one polysilicon contact node being disposed entirely within the substrate and the set of node films; and forming a contact region within the trench above the set of contact nodes and completely covering a top surface of the set of polysilicon contact nodes, the contact region substantially connected to the set of contact nodes and the substrate. - View Dependent Claims (14, 15, 16, 17, 18)
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Specification