Slew rate and shunting control separation
First Claim
1. A scanning system comprising:
- a first gate line driver including;
a first scan line,a first voltage line and a second voltage line,a first p-type transistor coupled to the first voltage line and the first scan line, the p-type transistor configured to control a rise time of the first scan line,a first n-type transistor coupled to the second voltage line and the first scan line, the first n-type transistor configured to control a fall time of the first scan line by providing a first shunting resistance greater than a predetermined amount, anda second n-type transistor coupled to the second voltage line and the first scan line, the second n-type transistor configured to provide a second shunting resistance less than the predetermined amount, wherein the first and second n-type transistors are both configured to be on when the second n-type transistor provides the second shunting resistance.
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Abstract
Setting a slew rate, e.g., a rising time or a falling time, of a scanning signal can be performed with a first operation, and a shunting resistance of the scanning line can be set with a second operation. A scanning system that scans a display screen, a touch screen, etc., can set a desired slew rate during a first period of time and can set a desired shunting resistance during a second period of time. A gate line system can sequentially scan gate lines to display an image during a display phase of a touch screen. The gate line system can, for example, increase the falling times of gate line signals. After the falling gate line signal has stabilized, for example, the gate line system can decrease the shunting resistance of the gate line.
35 Citations
20 Claims
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1. A scanning system comprising:
a first gate line driver including; a first scan line, a first voltage line and a second voltage line, a first p-type transistor coupled to the first voltage line and the first scan line, the p-type transistor configured to control a rise time of the first scan line, a first n-type transistor coupled to the second voltage line and the first scan line, the first n-type transistor configured to control a fall time of the first scan line by providing a first shunting resistance greater than a predetermined amount, and a second n-type transistor coupled to the second voltage line and the first scan line, the second n-type transistor configured to provide a second shunting resistance less than the predetermined amount, wherein the first and second n-type transistors are both configured to be on when the second n-type transistor provides the second shunting resistance. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12)
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13. A method of scanning a plurality of scan lines included a scanning system, the method comprising:
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receiving a first voltage line; connecting a scan line to a first voltage line through a first n-type transistor, in response to the first voltage line; receiving a previous scan line and a first clock signal; connecting the scan line to a second voltage line through a p-type transistor in response to the previous scan line and a rise of the first clock signal, the p-type transistor configured to control a rise time of the scan line; connecting the scan line to the first voltage line through a first n-type transistor in response to the previous scan line and a fall of the first clock signal, the first n-type transistor configured to control a fall time of the scan line; and connecting the scan line to the first voltage line through both the first n-type transistor and a second n-type transistor. - View Dependent Claims (14, 15, 16)
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17. A system for driving one or more common electrode lines, the system comprising:
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a first p-type transistor and a second p-type transistor, wherein a size of the second p-type transistor is larger than a size of the first p-type transistor; and a first n-type transistor and a second n-type transistor, wherein a size of the second n-type transistor is larger than a size of the first n-type transistor. - View Dependent Claims (18, 19, 20)
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Specification