Method for detecting and treating insulation lead-to-housing failures

• US 9,427,577 B2
• Filed: 08/07/2014
• Issued: 08/30/2016
• Est. Priority Date: 06/01/2012
• Status: Active Grant

• Current Assignee: Lambda Nu Technology LLC
• Original Assignee: Lambda Nu Technology LLC
• Inventors: Kroll, Mark W., Swerdlow, Charles D.
• Primary Examiner(s): KAHELIN, MICHAEL WILLIAM
• Application Number:
  US14/453,679
• Publication Number:
  US 20150151118A1
• Time in Patent Office: 754 Days
• US Class Current: 1/1
• CPC Class Codes: A61N 1/0563 specially adapted for defibrillation or cardioversion
• CPC Class Codes: A61N 1/37 Monitoring; Protecting
• CPC Class Codes: A61N 1/3906 characterised by the form of the shockwave
• CPC Class Codes: A61N 1/3925 Monitoring; Protecting
• CPC Class Codes: A61N 1/3931 Protecting, e.g. back-up systems
• CPC Class Codes: A61N 1/3956 Implantable devices for applying electric shocks to the heart, e.g. for cardioversion

Abstract

Disclosed is a method for the diagnosis of conductor anomalies, such as an insulation failure resulting in a short circuit, in an implantable medical device, such as an implantable cardioverter defibrillator (ICD). Upon determining if a specific defibrillation pathway is shorted, the method excludes the one electrode from the defibrillation circuit, delivering defibrillation current only between functioning defibrillation electrodes. Protection can be provided against a short in the right-ventricular coil-CAN defibrillation pathway of a pectoral, transvenous ICD with a dual-coil defibrillation lead. If a short caused by an in-pocket abrasion is present, the CAN is excluded from the defibrillation circuit, delivering defibrillation current only between the right-ventricular and superior vena cava defibrillation coils. Determination that the defibrillation pathway is shorted may be made by conventional low current measurements or delivery of high current extremely short test pulses.

Claims

1. An automated method of periodically monitoring for a potential short circuit in an implantable defibrillation system comprising:

causing the implantable defibrillation system to perform the steps of;

periodically forming a defibrillation pathway among at least two of an implantable cardioverter defibrillator generator housing (CAN) electrode a superior vena cava (SVC) electrode and a right ventricle (RV) electrode;

measuring an impedance of the defibrillation pathway using a high voltage, short duration pulse;

determining if the impedance is within a low impedance range indicative of a short circuit;

wherein periodically forming the defibrillation pathway is scheduled on an approximately monthly schedule;

wherein measuring the impedance of the defibrillation pathway uses a high current, short duration, test pulse at successively increasing voltages; and

in response to determining that the impedance is in the low impedance range, altering a configuration for delivery of a defibrillation shock into the defibrillation pathway to restrict use of a conductor associated with the defibrillation pathway that has low impedance range.

2. The automated method of claim 1, wherein a maximum voltage for the test pulse is about 400 V.

3. The automated method of claim 2, further comprising altering delivery of the defibrillation shock by lowering the voltage of the defibrillation shock to the maximum safe voltage for the conductor associated with the defibrillation pathway that has low impedance range.

4. The automated method of claim 1, wherein a maximum voltage for the test pulse is about 800 V.

5. The automated method of claim 1, wherein a first maximum voltage for the test pulse is set for every month and a second maximum voltage is set for every six months.

6. An automated method of periodically monitoring for a potential short circuit in an implantable defibrillation system comprising:

causing the implantable defibrillation system to perform the steps of;

periodically forming a defibrillation pathway among at least two of an implantable cardioverter defibrillator generator housing (CAN) electrode a superior vena cava (SVC) electrode and a right ventricle (RV) electrode;

measuring an impedance of the defibrillation pathway using a high voltage, short duration pulse;

determining if the impedance is within a low impedance range indicative of a short circuit;

wherein measuring the impedance of the defibrillation pathway uses a high current, short duration test pulse at successively increasing voltages concurrently with regular capacitor charging maintenance of the implantable defibrillation system; and

in response to determining that the impedance is in the low impedance range, altering a configuration for delivery of a defibrillation shock into the defibrillation pathway to restrict use of a conductor associated with the defibrillation pathway that has a low impedance range.

7. An automated method of periodically monitoring for a potential short circuit in an implantable defibrillation system comprising:

causing the implantable defibrillation system to perform the steps of;

periodically forming a defibrillation pathway among at least two of an implantable cardioverter defibrillator generator housing (CAN) electrode a superior vena cava (SVC) electrode and a right ventricle (RV) electrode;

measuring an impedance of the defibrillation pathway using a high voltage, short duration pulse;

determining if the impedance is within a low impedance range indicative of a short circuit;

in response to determining that the impedance is in the low impedance range, altering a configuration for delivery of a defibrillation shock into the defibrillation pathway to restrict use of a conductor associated with the defibrillation pathway that has a low impedance range; and

wherein measuring the impedance of the defibrillation pathway uses a high current, short duration test pulse at successively increasing voltages, and wherein the automated method further comprises;

recording, for the defibrillation pathway, a maximum safe voltage that corresponds to the highest voltage at which the impedance was not in the low impedance range.

8. The automated method of claim 7, wherein the low impedance range is defined by an impedance of 0 to 30Ω

.