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Multi-resolution detectors for measuring and controlling a charged particle pencil beam

  • US 9,427,599 B1
  • Filed: 02/26/2015
  • Issued: 08/30/2016
  • Est. Priority Date: 02/26/2015
  • Status: Active Grant
First Claim
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1. A system for detecting a characteristic of a charged particle pencil beam, the system comprising:

  • a multi-resolution detector disposed proximal to an isocenter plane, said multi-resolution detector comprising;

    a first pixelated electrode comprising a plurality of sub-arrays of first pixels, wherein each respective first pixel at each relative position in each sub-array is electrically connected in parallel with one another, such that said first pixelated electrode dynamically generates a first output representing a combined electrical output of said respective first pixels from said sub-arrays, said first pixels detecting an electrical current created by said charged particle pencil beam;

    a second pixelated electrode comprising a plurality of second pixels, said second pixelated electrode configured to dynamically generate a second output representative of an approximate physical position of the charged particle pencil beam in a plane substantially parallel to said isocenter plane, said second pixelated electrode having a second resolution less than a first resolution of said first pixelated electrode; and

    a high-voltage plane disposed between said first and second pixelated electrodes;

    a diagnostic control system comprising a memory and a processor, the diagnostic control system configured to receive as inputs the first output and the second output and to determine an actual position and an actual transverse intensity distribution of said charged particle beam based on said first and second outputs, said actual position and said actual intensity distribution having said first resolution.

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