Scanning systems

• US 9,429,530 B2
• Filed: 12/27/2013
• Issued: 08/30/2016
• Est. Priority Date: 02/28/2008
• Status: Active Grant

• Current Assignee: Rapiscan Systems Incorporated (OSI Systems Incorporated)
• Original Assignee: Rapiscan Systems Incorporated (OSI Systems Incorporated)
• Inventors: Morton, Edward James
• Primary Examiner(s): Makiya, David J
• Assistant Examiner(s): FOX, DANIELLE A
• Application Number:
  US14/142,286
• Publication Number:
  US 20140185771A1
• Time in Patent Office: 977 Days
• Field of Search: 378/86, 378/87
• US Class Current: 1/1
• CPC Class Codes: G01N 23/201 by measuring small-angle scattering
• CPC Class Codes: G01V 5/224 Multiple energy techniques using one type of radiation, e.g. X-rays of different energies

Abstract

The present application discloses methods and systems for scanning an object. The scanning system provides a first detector region having a thickness of at least 2 mm and a second detector region having a thickness of at least 5 mm. The second detector region is arranged to receive radiation that has passed through the first detector region. The method includes irradiating the object with radiation having having a peak energy of at least 1 MeV, and detecting the first profile radiation after it has interacted with or passed through the object in order to provide information relating to the object.

Claims

1. A scanning method for scanning an object comprising:

providing a first detector region having a thickness of at least 2 mm and a second detector region having a thickness of at least 5 mm wherein the second detector region is arranged to receive radiation that has passed through the first detector region;

irradiating the object with a first high energy radiation profile;

detecting the first high energy profile radiation after it has interacted with or passed through the object in order to provide information relating to the object, wherein detecting the first high energy profile radiation comprises;

detecting the first high energy profile radiation at the first detector region;

receiving the first high energy profile radiation that has passed through the first detector region at the second detector region;

detecting the first high energy profile radiation at the second detector region;

irradiating the object with a second low energy radiation profile

detecting the second low energy profile radiation after it has interacted with or passed through the object in order to provide information relating to the object, wherein detecting the second low energy profile radiation comprises;

detecting the second low energy profile radiation at the first detector region;

receiving the second low energy profile radiation that has passed through the first detector region at the second detector region;

detecting the second low energy profile radiation at the second detector region;

wherein the first detector region is positioned between the object and the second detector region; and

calculating a ratio, (A/B)₁/(A/B)₂ in order to determine information relating to the object based upon said ratio, wherein A is indicative of an amount of radiation detected at the first detector region, B is indicative of an amount of radiation detected at the second detector region, (A/B)₁ is a ratio of the first high energy profile radiation detected at the first detector region relative to first high energy profile radiation detected at the second detector region, and (A/B)₂ is a ratio of the second low energy profile radiation detected at the first detector region relative to second low energy profile radiation detected at the second detector region.

2. The method of claim 1 comprising determining said information relating to the object by inputting information from the first detector region and the second detector regions relating to the first high energy profile radiation and second low energy profile radiation into a least squares minimization technique to obtain information relating to the object.

3. The method of claim 1 comprising irradiating and detecting the first high energy profile radiation before the second low energy profile radiation.

4. The method of claim 1 wherein irradiating the object comprises irradiating the object in discrete bursts.

6. The method of claim 1 comprising configuring the first detector region and the second detector region to detect a predetermined amount of radiation relative to each other.

7. The method of claim 6 comprising configuring the first detector region and the second detector region to detect substantially a same amount of radiation as each other.

8. The method of claim 6 comprising configuring any one or more of size, shape or material of the first detector region or second detector region so that the first detector region and the second detector region detect the predetermined amount of radiation relative to each other.

9. The method of claim 1 comprising providing a first detector including the first detector region and a second detector including the second detector region.

10. The method of claim 1 comprising irradiating the object with radiation at more than two energy profiles.

5. The method of claim comprising sending detected information received in response to a burst from the detector regions before a next burst occurs.

11. A scanning system for scanning an object comprising:

a variable energy level radiation source arranged to irradiate an object with radiation having a plurality of different energy profiles including a first high energy profile having a peak energy ranging from 1 MeV to 6 MeV and a second low energy profile having a peak energy ranging from 0.5 MeV to 3 MeV; and

a detector arrangement arranged to detect radiation after it has interacted with the object, wherein the detector arrangement comprises a first detector region having a thickness of at least 2 mm and arranged to detect radiation and a second detector region having a thickness of at least 5 mm and arranged to detect radiation wherein the first detector region is positioned between the object and the second detector region, further comprising a controller wherein the controller is arranged to calculate a ratio, (A/B)₁/(A/B)₂ in order to determine information relating to the object based upon the calculated ratio, wherein A is indicative of an amount of radiation detected at the first detector region, B is indicative of an amount of radiation detected at the second detector region, (A/B)₁ is a ratio of a first profile radiation detected at the first detector region relative to first profile radiation detected at the second detector region, and (A/B)₂ is a ratio of a second profile radiation detected at the first detector region relative to second profile radiation detected at the second detector region.

12. The scanning system of claim 11 wherein the controller is further arranged to coordinate a timing of irradiation events such that detected information obtained in response to one of the irradiation events is sent from the first and second detector regions before a subsequent irradiation event occurs.

13. The scanning system of claim 11 wherein the controller is further arranged to determine information relating to the object based upon information from the first and second detector regions relating to the first profile radiation and second profile radiation.

14. The scanning system of claim 13 wherein the controller is arranged to determine information by inputting the information from the first and second detector regions relating to the first profile radiation and second profile radiation into a least squares minimization technique to obtain information relating to the object.

15. The scanning system of claim 11 comprising a plurality of detector arrays, each detector array comprising a first detector region and a second detector region.

16. The scanning system of claim 15 comprising a concentrator and switch arranged to coherently relay gathered information from the first and second detector regions.

17. The scanning system of claim 11 wherein the first detector region and the second detector region are configured to detect substantially a same amount of radiation as each other.