Determining and storing bit error rate relationships in spin transfer torque magnetoresistive random-access memory (STT-MRAM)
First Claim
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1. A method of managing memory, the method comprising:
- determining a performance characteristic of a memory based on a relationship between a bit error rate, a programming pulse width, and one or more of;
a temperature, a history-based predictive performance parameter, a coding scheme for data, or a voltage level associated with the memory, wherein the programming pulse width is a length of a pulse used to write the data;
storing the performance characteristic in the memory; and
managing a write operation associated with the memory using the stored performance characteristic, wherein using the performance characteristic includes determining whether to perform at least one of a long write operation, a sequence of short write operations, or a single short write operation.
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Abstract
Systems and methods to manage memory on a spin transfer torque magnetoresistive random-access memory (STT-MRAM) are provided. A particular method may include determining a performance characteristic using relationship information that relates a bit error rate to at least one of a programming pulse width, a temperature, a history-based predictive performance parameter, a coding scheme, and a voltage level also associated with a memory. The performance characteristic is stored and used to manage a write operation associated with the memory.
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Citations
15 Claims
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1. A method of managing memory, the method comprising:
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determining a performance characteristic of a memory based on a relationship between a bit error rate, a programming pulse width, and one or more of;
a temperature, a history-based predictive performance parameter, a coding scheme for data, or a voltage level associated with the memory, wherein the programming pulse width is a length of a pulse used to write the data;storing the performance characteristic in the memory; and managing a write operation associated with the memory using the stored performance characteristic, wherein using the performance characteristic includes determining whether to perform at least one of a long write operation, a sequence of short write operations, or a single short write operation. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12)
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13. A method of managing memory, the method comprising:
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determining a performance characteristic of a memory based on a relationship between two or more of;
a bit error rate, a programming pulse width, a temperature, a history-based predictive performance parameter, a coding scheme for data, or a voltage level associated with the memory, wherein the programming pulse width is a length of a pulse used to write the data;storing the performance characteristic in the memory; and managing a write operation associated with the memory based on the performance characteristic and based on a number of data flips that are to be performed in response to a determination that the temperature is above a first threshold value, wherein the number of data flips is based on an exclusive-OR operation; and determining the programming pulse width and subsequently performing one of;
a long write operation in response to a determination that the number of data flips is greater than a second threshold value or a short write operation in response to a determination that the number of data flips is less than the second threshold value. - View Dependent Claims (14)
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15. A method of managing memory, the method comprising:
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determining a performance characteristic of a memory based on a relationship between a programming pulse width, and one or more of;
a bit error rate, a temperature, a history-based predictive performance parameter, a coding scheme for data, or a voltage level associated with the memory, wherein the programming pulse width is a length of a pulse used to write the data;storing the performance characteristic in the memory; managing a write operation associated with the memory based on the performance characteristic and based on a number of data flips that are to be performed in response to a determination that the temperature is above a first threshold value, wherein the number of data flips is based on an exclusive-OR operation; and determining the programming pulse width and subsequently performing one of;
a long write operation in response to a determination that the number of data flips is greater than a second threshold value or a short write operation in response to a determination that the number of data flips is less than the second threshold value.
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Specification