Detecting device, detector, and imaging apparatus using the same

• US 9,437,646 B2
• Filed: 01/15/2013
• Issued: 09/06/2016
• Est. Priority Date: 01/19/2012
• Status: Active Grant

• Current Assignee: Canon Kabushiki Kaisha (Canon Inc.)
• Original Assignee: Canon Kabushiki Kaisha (Canon Inc.)
• Inventors: Sekiguchi, Ryota, Okuda, Masahiro
• Primary Examiner(s): Gregory, Bernarr
• Application Number:
  US13/742,195
• Publication Number:
  US 20130188041A1
• Time in Patent Office: 1,330 Days
• Field of Search: 342/21, 342/22, 342/27, 342/82, 342/89, 342/175, 342/176, 342/179, 342/42, 342/44, 343/700.R, 343/703, 343/720, 343/741, 343/744, 343/745, 343/753, 343/754, 343/772, 343/776, 343/778, 343/793, 343/802, 343/810, 343/812, 343/815, 343/816, 343/850, 343/907, 343/909, 343/912, 343/700.MS, 333/103, 333/104, 324/76.11, 324/95, 324/600, 324/629, 324/633, 324/636, 455/73, 455/78, 455/79, 455/82, 250/330, 250/332, 250/336.1, 250/338.1
• US Class Current: 1/1
• CPC Class Codes: G01N 21/3581 using far infrared light; using Terahertz radiation
• CPC Class Codes: G01S 13/003 Bistatic radar systems; Multistatic radar systems
• CPC Class Codes: G01S 13/0209 Systems with very large relative bandwidth, i.e. larger than 10 %, e.g. baseband, pulse, carrier-free, ultrawideband
• CPC Class Codes: G01S 7/024 using polarisation effects in waveguides H01P1/165; for aerials H01Q, e.g. H01Q15/22, H01Q15/24, H01Q19/195
• CPC Class Codes: G01S 7/032 Constructional details for solid-state radar subsystems
• CPC Class Codes: H01L 27/14669 Infrared imagers
• CPC Class Codes: H01Q 1/36 Structural form of radiating elements, e.g. cone, spiral, umbrella; Particular materials used therewithH01Q1/08, H01Q1/14 take precedence

Abstract

A detecting device which detects electromagnetic waves includes an antennal configured to receive electromagnetic waves, and a plurality of semiconductor rectifying devices serially connected to the antenna, and connected in parallel to each other such that the polarity is aligned, so as to receive electromagnetic waves propagated from the antenna, wherein the plurality of semiconductor rectifying devices are each disposed at positions where the phase of electromagnetic waves propagated from the antenna is substantially the same phase.

Claims

1. A detecting device which detects electromagnetic waves, the detecting device comprising:

an antenna configured to receive electromagnetic waves; and

a plurality of semiconductor rectifying devices serially connected to the antenna, and connected in parallel to each other such that the polarity is aligned,

wherein the plurality of semiconductor rectifying devices are in contact with the antenna or connected to the antenna via a transmission line to rectify electromagnetic waves received by the antenna and transmitted, directly or via the transmission line, to the plurality of semiconductor rectifying devices, and

wherein the plurality of semiconductor rectifying devices are each disposed at positions where the phase of electromagnetic waves propagated from the antenna is substantially the same phase.

2. The detecting device according to claim 1, wherein the plurality of semiconductor rectifying devices are disposed in parallel to the same wave front of the electromagnetic waves propagated from the antenna.

3. The detecting device according to claim 1, wherein at least one conductor making up the antenna and the semiconductor rectifying devices are electrically serially connected via a semiconductor layer.

4. The detecting device according to claim 1, wherein the antenna is configured of a pair of conductors, with the plurality of semiconductor rectifying devices being juxtaposed in contact with one of the pair.

5. The detecting device according to claim 4, wherein the pair of antennas is made up of two conductors which are disposed on a substrate in a non-contacting state.

6. The detecting device according to claim 1, wherein the antenna has formed thereto a salient portion, with the salient portion being situated between the plurality of semiconductor rectifying devices.

7. The detecting device according to claim 1, wherein the transmission line is connected to the antenna and the plurality of semiconductor rectifying devices.

8. The detecting device according to claim 1, wherein the plurality of semiconductor rectifying devices are disposed at a position where the absolute value of phase difference of the electromagnetic waves propagated from the antenna is 0 or greater and π

/16 or smaller.

9. The detecting device according to claim 8, wherein the plurality of semiconductor rectifying devices are disposed at a position where the absolute value of phase difference of the electromagnetic waves propagated from the antenna is 0 or greater and π

/32 or smaller.

10. The detecting device according to claim 1, wherein, the plurality of semiconductor rectifying devices are equal in the area of a cross-section perpendicular to the direction in which current flows at a junction making up the semiconductor rectifying devices.

11. The detecting device according to claim 10, wherein the area of the junction is 10 μ

m² or smaller.

12. The detecting device according to claim 10, wherein the junction of the each of the plurality of semiconductor rectifying devices is a cylindrical shape surrounded by a dielectric.

13. The detecting device according to claim 1, wherein the plurality of semiconductor rectifying devices are formed using silicon.

14. The detecting device according to claim 13, wherein the plurality of semiconductor rectifying devices are Schottky barrier diodes or planar doped barrier diodes.

15. The detecting device according to claim 1, wherein the plurality of semiconductor rectifying devices are formed using a compound semiconductor material.

16. The detecting device according to claim 15, wherein the plurality of semiconductor rectifying devices are formed using a Group III-V semiconductor material.

17. The detecting device according to claim 1, the detecting device detecting electromagnetic waves of a frequency band including a part of 30 GHz to 30 THz.

18. The detecting device according to claim 1, wherein at least two of the plurality of semiconductor rectifying devices are each disposed at positions where the phase of electromagnetic waves propagated from the antenna is substantially the same phase.

19. A detector to detect electromagnetic waves, the detector comprising:

a detecting device which detects electromagnetic waves, the detecting device comprising;

an antenna configured to receive electromagnetic waves; and

a plurality of semiconductor rectifying devices serially connected to the antenna, and connected in parallel to each other such that the polarity is aligned,

wherein the plurality of semiconductor rectifying devices are in contact with the antenna or connected to the antenna via a transmission line to rectify electromagnetic waves received by the antenna and transmitted, directly or via the transmission line, to the plurality of semiconductor rectifying devices, and

wherein the plurality of semiconductor rectifying devices are each disposed at positions where the phase of electromagnetic waves propagated from the antenna is substantially the same phase; and

a measuring unit configured to measure an electric field at the antenna.

20. An imaging apparatus to perform image pickup of an object of measurement using electromagnetic waves, the imaging apparatus comprising:

an oscillator configured to oscillate electromagnetic waves of a frequency band including a part of 30 GHz to 30 THz;

a detector to detect electromagnetic waves, the detector comprising;

a detecting device which detects electromagnetic waves, the detecting device comprising;

an antenna configured to receive electromagnetic waves; and

a plurality of semiconductor rectifying devices serially connected to the antenna, and connected in parallel to each other such that the polarity is aligned,

wherein the plurality of semiconductor rectifying devices are in contact with the antenna or connected to the antenna via a transmission line to rectify electromagnetic waves received by the antenna and transmitted, directly or via the transmission line, to the plurality of semiconductor rectifying devices, and

wherein the plurality of semiconductor rectifying devices are each disposed at positions where the phase of electromagnetic waves propagated from the antenna is substantially the same phase; and

a measuring unit configured to measure an electric field at the antenna; and

an image constructing unit configured to construct an image relating to the object of measurement, based on electromagnetic waves detected by the detector.