×

Simultaneous imaging and precision alignment of two millimeter wave antennas based on polarization-selective machine vision

  • US 9,437,923 B2
  • Filed: 10/15/2012
  • Issued: 09/06/2016
  • Est. Priority Date: 10/15/2012
  • Status: Active Grant
First Claim
Patent Images

1. A system for imaging and aligning antennas, said system comprising:

  • an overlay imaging aligner comprising;

    at least two antennas forming a straight line beam path with a polarization beam splitter therebetween;

    a polarization gate arranged perpendicularly to said straight line beam path;

    a non-polarizing beam splitter aligned with said polarization gate on an opposite side of said polarization beam splitter along a perpendicular straight line beam path;

    a beam dump and an alignment beam arranged on opposite sides of said non-polarizing beam splitter; and

    at least one imaging lens and a common detector array aligned along said perpendicular straight line beam path, wherein said overlay imaging aligner aligns said at least two antennas by overlaying simultaneous digital images associated with said at least two antennas on said common detector array.

View all claims
  • 1 Assignment
Timeline View
Assignment View
    ×
    ×