System and method for calibrating temperatures sensor for integrated circuits

• US 9,442,025 B2
• Filed: 10/30/2013
• Issued: 09/13/2016
• Est. Priority Date: 10/30/2013
• Status: Active Grant

• Current Assignee: Apple Inc.
• Original Assignee: Apple Inc.
• Inventors: Yang, Yizhang, Zhai, Jun
• Primary Examiner(s): KAPLAN VERBITSKY, GAIL
• Application Number:
  US14/066,942
• Publication Number:
  US 20150117486A1
• Time in Patent Office: 1,049 Days
• Field of Search: 374/100, 374/102, 374 43- 45, 374/4, 374/5, 374/1, 374/152, 374/170, 374/178, 374/137, 374/166, 374/110, 374/111, 374/112, 374/163, 327/512, 327/513, 702/130, 702/99, 324/750.03
• US Class Current: 1/1
• CPC Class Codes: G01K 15/005 Calibration
• CPC Class Codes: G01K 7/01 using semiconducting elements having PN junctions G01K7/02, G01K7/16, G01K7/30 take precedence
• CPC Class Codes: H01L 2224/48091 Arched
• CPC Class Codes: H01L 2924/00014 the subject-matter covered by the group, the symbol of which is combined with the symbol of this group, being disclosed without further technical details

Abstract

In some embodiments, a method may be provided for calibrating integrated circuit temperature sensors. The method may include sensing a first temperature using a first temperature sensor and a second temperature using a second temperature sensor. The first temperature sensor may be calibrated and is external to a package of the integrated circuit. The second temperature sensor may be included in the integrated circuit. The method may include increasing a temperature of the integrated circuit. The method may include allowing the integrated circuit and the package to thermally equilibrate over a first period of time. The method may include sensing a first slope of a temperature decay by the first temperature sensor. The method may include sensing a second slope of a temperature decay by the second temperature sensor. The method may include calibrating the second temperature sensor responsive to a difference between the first and second temperatures and the first and second slopes.

Claims

1. A method for calibrating integrated circuit temperature sensors, comprising:

sensing a first temperature using a first temperature sensor and a second temperature using a second temperature sensor, wherein the first temperature sensor is calibrated and is external to a package of the integrated circuit, and wherein the second temperature sensor is included in the integrated circuit;

increasing a temperature of the integrated circuit;

allowing the integrated circuit and the package to thermally equilibrate over a first period of time;

sensing a first slope of a temperature decay by the first temperature sensor;

sensing a second slope of a temperature decay by the second temperature sensor;

comparing the first temperature to the second temperature to determine a temperature offset;

comparing the first slope to the second slope to determine a slope offset; and

calibrating the second temperature sensor using the temperature offset and the slope offset.

2. The method of claim 1, wherein said increasing comprises increasing an applied voltage to the integrated circuit such that the temperature of the integrated circuit is increased.

3. The method of claim 1, wherein said increasing comprises executing a power intensive program on a processor included in the integrated circuit.

4. The method of claim 1, wherein the second temperature sensor is initially uncalibrated.

5. The method of claim 1, wherein said sensing a first slope comprises sensing at least a third and a fourth temperature over a second period of time using the first temperature sensor.

6. The method of claim 5, wherein said sensing a second slope comprises sensing at least a fifth and a sixth temperature over a third period of time using the second temperatures sensor.

7. The method of claim 6, wherein the second period of time and the third period of time are substantially equivalent.

8. The method of claim 1, wherein said calibrating comprises using the first temperature and the first slope as a standard and adjusting for differences between the first temperature and the first slope and the second temperature and the second slope.

9. The method of claim 1, further comprising burning in a correction in the second temperature sensor using the calibration.

10. A non-transitory computer accessible memory medium storing program instructions for calibrating integrated circuit temperature sensors, wherein the program instructions are executable by a processor to:

sense a first temperature using a first temperature sensor and a second temperature using a second temperature sensor, wherein the first temperature sensor is calibrated and is external to a package of the integrated circuit, and wherein the second temperature sensor is included in the integrated circuit;

increase a temperature of the integrated circuit;

allow the integrated circuit and the package to thermally equilibrate over a first period of time;

sense a first slope of a temperature decay by the first temperature sensor;

sense a second slope of a temperature decay by the second temperature sensor;

compare the first temperature to the second temperature to determine a temperature offset;

compare the first slope to the second slope to determine a slope offset; and

calibrate the second temperature sensor using the temperature offset and the slope offset.

11. The memory medium of claim 10, wherein said increase comprises increasing an applied voltage to the integrated circuit such that the temperature of the integrated circuit is increased.

12. The memory medium of claim 10, wherein said increase comprises executing a power intensive program on a processor included in the integrated circuit.

13. The memory medium of claim 10, wherein said calibrate comprises using the first temperature and the first slope as a standard and adjusting for differences between the first temperature and the first slope and the second temperature and the second slope.

14. The memory medium of claim 10, wherein the second temperature sensor is initially uncalibrated.

15. The memory medium of claim 10, wherein said sense a first slope comprises sensing at least a third and a fourth temperature over a second period of time using the first temperature sensor.

16. The memory medium of claim 15, wherein said sense a second slope comprises sensing at least a fifth and a sixth temperature over a third period of time using the second temperatures sensor.

17. The memory medium of claim 16, wherein the second period of time and the third period of time are substantially equivalent.

18. The memory medium of claim 10, wherein the instructions are further executable by the processor to burn in a correction in the second temperature sensor using the calibration.

19. A method for calibrating integrated circuit temperature sensors, comprising:

sensing a first temperature using a first temperature sensor and a second temperature using a second temperature sensor, wherein the first temperature sensor is calibrated and is external to a package of the integrated circuit, and wherein the second temperature sensor is included in the integrated circuit;

increasing a temperature of the integrated circuit comprising increasing an applied voltage to the integrated circuit such that the temperature of the integrated circuit is increased;

allowing the integrated circuit and the package to thermally equilibrate over a first period of time;

sensing a first slope of a temperature decay by the first temperature sensor;

sensing a second slope of a temperature decay by the second temperature sensor;

comparing the first temperature to the second temperature to determine a temperature offset;

comparing the first slope to the second slope to determine a slope offset;

calibrating the second temperature sensor using the temperature offset and the slope offset; and

burning in a correction in the second temperature sensor using the calibration.

20. The method of claim 19, wherein said increasing comprises executing a power intensive program on a processor included in the integrated circuit.