X-ray inspection system and method

• US 9,442,082 B2
• Filed: 07/13/2015
• Issued: 09/13/2016
• Est. Priority Date: 04/25/2003
• Status: Active Grant

• Current Assignee: Rapiscan Systems Incorporated (OSI Systems Incorporated)
• Original Assignee: Rapiscan Systems Incorporated (OSI Systems Incorporated)
• Inventors: Morton, Edward James, Baldwin, Francis
• Primary Examiner(s): Artman, Thomas R
• Application Number:
  US14/798,195
• Publication Number:
  US 20160018342A1
• Time in Patent Office: 428 Days
• US Class Current: 1/1
• CPC Class Codes: A61B 6/032 Transmission computed tomography [CT]
• CPC Class Codes: A61B 6/4028 resulting in acquisition of views from substantially different positions, e.g. EBCT
• CPC Class Codes: A61B 6/4085 Cone-beams
• CPC Class Codes: A61B 6/4208 characterised by using a particular type of detector
• CPC Class Codes: A61B 6/4233 using matrix detectors
• CPC Class Codes: A61B 6/4241 using energy resolving detectors, e.g. photon counting
• CPC Class Codes: A61B 6/4266 characterised by using a plurality of detector units A61B6/4014 takes precedence
• CPC Class Codes: A61B 6/463 characterised by displaying multiple images or images and diagnostic data on one display
• CPC Class Codes: A61B 6/482 involving multiple energy imaging
• CPC Class Codes: A61B 6/5205 involving processing of raw data to produce diagnostic data
• CPC Class Codes: A61B 6/542 involving control of exposure
• CPC Class Codes: G01N 2223/601 density profile
• CPC Class Codes: G01N 2223/639 material in a container
• CPC Class Codes: G01N 23/04 and forming images of the material
• CPC Class Codes: G01N 23/083 the radiation being X-rays
• CPC Class Codes: G01N 23/087 using polyenergetic X-rays
• CPC Class Codes: G01T 1/2008 using a combination of different types of scintillation detectors, e.g. phoswich
• CPC Class Codes: G01T 1/2985 In depth localisation, e.g. using positron emitters; Tomographic imaging (longitudinal and transverse section imaging; apparatus for radiation diagnosis sequentially in different planes, steroscopic radiation diagnosis); using external radiation sources A61B6/02
• CPC Class Codes: G01V 5/20 Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects

Abstract

The present specification discloses an X-ray system for processing X-ray data to determine an identity of an object under inspection. The X-ray system includes an X-ray source for transmitting X-rays, where the X-rays have a range of energies, through the object, a detector array for detecting the transmitted X-rays, where each detector outputs a signal proportional to an amount of energy deposited at the detector by a detected X-ray, and at least one processor that reconstructs an image from the signal, where each pixel within the image represents an associated mass attenuation coefficient of the object under inspection at a specific point in space and for a specific energy level, fits each of pixel to a function to determine the mass attenuation coefficient of the object under inspection at the point in space; and uses the function to determine the identity of the object under inspection.

Claims

1. An X-ray system for processing X-ray data to determine an identity of an object under inspection, comprising:

an X-ray source for transmitting a plurality of X-rays, wherein said X-rays have a range of energies, through the object; and

a detector array for detecting said transmitted X-rays, wherein said detector array comprises a first set of detectors and a second set of detectors, wherein each of said first set of detectors comprise scintillator material and a filter configured relative to the scintillator material such that the transmitted X-rays pass through the filter before passing through the scintillator material, wherein each of said second set of detectors comprise scintillator material and do not comprise a filter, and wherein 1% to 4% of the detector array comprises the first set of detectors and wherein 99% to 96% of the detector array comprises the second set of detectors.

2. The X-ray system of claim 1 wherein the filter comprises copper with a thickness ranging from 0.2 to 0.5 mm.

3. The X-ray system of claim 1 wherein the first set of detectors detect a higher net energy X-ray spectrum than the second set of detectors.

4. The X-ray system of claim 1 wherein the first set of detectors and the second set of detectors are arranged in a tessellated pattern in the detector array.

5. The X-ray system of claim 1 wherein the first set of detectors and the second set of detectors are arranged in alternating rows in the detector array.

6. The X-ray system of claim 1 wherein output signals from said first set of detectors are used to generate a first image and wherein output signals from said second set of detectors are used to generate a second image.

7. The X-ray system of claim 6 wherein the first image has a lower resolution than said second image.

8. The X-ray system of claim 7 wherein the first image has a higher energy than said second image.

9. The X-ray system of claim 8 wherein the first image and second image are used in combination to generate a dual energy analysis of said object.