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Bad memory unit detection in a solid state drive

  • US 9,443,616 B2
  • Filed: 04/28/2014
  • Issued: 09/13/2016
  • Est. Priority Date: 04/02/2014
  • Status: Active Grant
First Claim
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1. An apparatus comprising:

  • a memory configured to store data, the memory comprising a plurality of dies each (i) having a size less than a total size of the memory and (ii) comprising a plurality of planes, each of the planes comprising a plurality of blocks; and

    a controller configured to (i) process a plurality of input/output requests to/from the memory, (ii) determine which of the blocks are bad in each of the dies and planes, and (iii) determine whether to mark one or more of the dies as bad in response to a first test and whether to mark one or more planes within one of the dies as bad in response to a second test, wherein (a) the first test is configured to analyze the bad blocks in each of the dies, (b) if one of the dies fails the first test, the controller is configured to perform the second test on each of the planes of the die that failed the first test, (c) the second test is configured to analyze the bad blocks in each of the planes of the die that failed the first test, (d) the first test is based on determining whether a number of bad blocks in one of the dies exceeds a threshold number of bad blocks, (e) the second test is based on determining whether a number of bad blocks in one of the planes exceeds a threshold number of bad blocks and (f) the dies that fail the first test are not marked as bad if one or more planes in the dies that fail the first test do not fail the second test.

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