Method for testing a photonic integrated circuit including a device under test
First Claim
1. A method of testing a photonic integrated circuit (IC) comprising a test structure and a deembedding structure, the test structure comprising a test optical splitter, a test optical input coupled to an input of the test optical splitter, first and second test optical outputs coupled to respective first and second outputs of the test optical splitter, and a device under test (DUT) coupled between the first test optical output and the first output of the test optical splitter;
- the deembedding structure comprising a deembedding optical splitter, a deembedding optical input coupled to an input of the deembedding optical splitter, and first and second deembedding optical outputs coupled to respective first and second outputs of the deembedding optical splitter;
the method comprising;
coupling a test probe device to the test optical input, first and second test optical outputs, the deembedding optical input, and first and second deembedding optical outputs;
operating the test probe device to make at least one test measurement related to the DUT, and at least one deembedding measurement; and
processing the at least one test measurement and the at least one deembedding measurement to thereby determine whether the DUT is acceptable and independent of alignment error.
1 Assignment
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Accused Products
Abstract
A method is for testing a photonic integrated circuit (IC) that includes a test structure having a test optical splitter, a test optical input, and first and second test optical outputs. A device under test (DUT) is coupled between the first test optical output and the first output of the test optical splitter. The deembedding structure includes a deembedding optical splitter, a deembedding optical input and first and second deembedding optical outputs. The method includes coupling a test probe device to the test optical inputs and outputs and the deembedding optical inputs and outputs and operating the test probe device to make at least one test measurement related to the DUT and at least one deembedding measurement. The at least one test measurement is processed with the at least one deembedding measurement to determine whether the DUT is acceptable and independent of alignment error.
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Citations
20 Claims
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1. A method of testing a photonic integrated circuit (IC) comprising a test structure and a deembedding structure, the test structure comprising a test optical splitter, a test optical input coupled to an input of the test optical splitter, first and second test optical outputs coupled to respective first and second outputs of the test optical splitter, and a device under test (DUT) coupled between the first test optical output and the first output of the test optical splitter;
- the deembedding structure comprising a deembedding optical splitter, a deembedding optical input coupled to an input of the deembedding optical splitter, and first and second deembedding optical outputs coupled to respective first and second outputs of the deembedding optical splitter;
the method comprising;coupling a test probe device to the test optical input, first and second test optical outputs, the deembedding optical input, and first and second deembedding optical outputs; operating the test probe device to make at least one test measurement related to the DUT, and at least one deembedding measurement; and processing the at least one test measurement and the at least one deembedding measurement to thereby determine whether the DUT is acceptable and independent of alignment error. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8)
- the deembedding structure comprising a deembedding optical splitter, a deembedding optical input coupled to an input of the deembedding optical splitter, and first and second deembedding optical outputs coupled to respective first and second outputs of the deembedding optical splitter;
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9. A test probe device for testing a photonic integrated circuit (IC) comprising a test structure and a deembedding structure, the test structure comprising a test optical splitter, a test optical input coupled to an input of the test optical splitter, first and second test optical outputs coupled to respective first and second outputs of the test optical splitter, and a device under test (DUT) coupled between the first test optical output and the first output of the test optical splitter;
- the deembedding structure comprising a deembedding optical splitter, a deembedding optical input coupled to an input of the deembedding optical splitter, and first and second deembedding optical outputs coupled to respective first and second outputs of the deembedding optical splitter;
the test probe device comprising;a plurality of optical fibers to be temporarily coupled to the test optical input, first and second test optical outputs, the deembedding optical input, and first and second deembedding optical outputs; at least one optical transmitter and a plurality of optical receivers coupled to the plurality of optical fibers and configured to make at least one test measurement related to the DUT, and at least one deembedding measurement; and a processor coupled to the at least one optical transmitter and plurality of optical receivers and being configured to process the at least one test measurement and the at least one deembedding measurement to thereby determine whether the DUT is acceptable and independent of alignment error. - View Dependent Claims (10, 11, 12, 13, 14, 15)
- the deembedding structure comprising a deembedding optical splitter, a deembedding optical input coupled to an input of the deembedding optical splitter, and first and second deembedding optical outputs coupled to respective first and second outputs of the deembedding optical splitter;
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16. A photonic integrated circuit (IC) comprising:
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a test structure comprising a test optical splitter, a test optical input coupled to an input of the test optical splitter, first and second test optical outputs coupled to respective first and second outputs of the test optical splitter, and a device under test (DUT) coupled between the first test optical output and the first output of the test optical splitter; and a deembedding structure comprising a deembedding optical splitter, a deembedding optical input coupled to an input of the deembedding optical splitter, and first and second deembedding optical outputs coupled to respective first and second outputs of the deembedding optical splitter; the test optical input, first and second test optical outputs, the deembedding optical input, and first and second deembedding optical outputs configured to be temporarily coupled to a test probe device to make at least one test measurement related to the DUT, and at least one deembedding measurement to thereby determine whether the DUT is acceptable and independent of alignment error. - View Dependent Claims (17, 18, 19, 20)
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Specification