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Devices and methods for analyzing layers of samples

  • US 9,453,764 B2
  • Filed: 07/21/2015
  • Issued: 09/27/2016
  • Est. Priority Date: 01/26/2015
  • Status: Active Grant
First Claim
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1. A system for analyzing layers of an analyte, the system comprising:

  • a paring subassembly including at least one paring member sized and shaped to remove layers of an analyte to expose underlying surfaces of the analyte;

    a mandrel subassembly including a mandrel defining a receptacle sized and shaped to retain the analyte as the layers of the analyte are removed;

    an actuation subassembly to;

    actuate the mandrel or the at least one paring member in one or more directions of movement with respect to one another to displace the analyte across the at least one paring member to remove a first layer of the analyte to expose a first surface; and

    actuate the mandrel to position the exposed first surface of the analyte over a window of a hyperspectral analyzation subassembly to be scanned by the hyperspectral analyzation subassembly through the window.

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