Devices and methods for analyzing layers of samples
First Claim
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1. A system for analyzing layers of an analyte, the system comprising:
- a paring subassembly including at least one paring member sized and shaped to remove layers of an analyte to expose underlying surfaces of the analyte;
a mandrel subassembly including a mandrel defining a receptacle sized and shaped to retain the analyte as the layers of the analyte are removed;
an actuation subassembly to;
actuate the mandrel or the at least one paring member in one or more directions of movement with respect to one another to displace the analyte across the at least one paring member to remove a first layer of the analyte to expose a first surface; and
actuate the mandrel to position the exposed first surface of the analyte over a window of a hyperspectral analyzation subassembly to be scanned by the hyperspectral analyzation subassembly through the window.
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Abstract
The present disclosure generally relates to systems, devices and methods for analyzing and processing samples or analytes. In one example configuration, a method of analyzing an analyte includes shaving a first layer of a plurality of layers of an analyte to expose a first surface of an analyte. The method includes positioning the first surface of the analyte over a window of a hyperspectral analyzation subassembly. The method further includes scanning the first surface of the analyte by the hyperspectral analyzation subassembly to obtain information regarding the analyte proximate the first surface. Other systems, devices and methods are disclosed herein.
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Citations
23 Claims
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1. A system for analyzing layers of an analyte, the system comprising:
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a paring subassembly including at least one paring member sized and shaped to remove layers of an analyte to expose underlying surfaces of the analyte; a mandrel subassembly including a mandrel defining a receptacle sized and shaped to retain the analyte as the layers of the analyte are removed; an actuation subassembly to; actuate the mandrel or the at least one paring member in one or more directions of movement with respect to one another to displace the analyte across the at least one paring member to remove a first layer of the analyte to expose a first surface; and actuate the mandrel to position the exposed first surface of the analyte over a window of a hyperspectral analyzation subassembly to be scanned by the hyperspectral analyzation subassembly through the window. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14)
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15. A method of analyzing a plurality of layers of an analyte comprising:
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for each of the plurality of layers; shaving the layer of the plurality of layers to expose an underlying surface of the analyte; after shaving, positioning the exposed surface of the analyte over a window of a hyperspectral analyzation subassembly; and after positioning the exposed surface over the window, scanning the exposed surface of the analyte by the hyperspectral analyzation subassembly to obtain information regarding the analyte proximate the exposed surface; and generating information regarding the plurality of layers of the analyte based at least in part on the obtained information. - View Dependent Claims (16, 17, 18, 19, 20)
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21. A filtered blade cartridge comprising:
a filtering device comprising; a first housing defining a first chamber and an outlet conduit fluidly coupled to the first chamber; a filter positioned inside of the first chamber and occluding the outlet conduit, wherein the filter permits fluids to pass through to the outlet conduit and separates solids to be collected in the first chamber; and a paring subassembly comprising two or more paring members sized and shaped to remove layers of an analyte to expose underlying surfaces of the analyte. - View Dependent Claims (22, 23)
Specification