Fault testing in storage devices
First Claim
1. A method of fault testing in a storage device, the method comprising:
- testing, in accordance with a storage device testing protocol, operability of a plurality of distinct portions on the storage device;
the testing including, for each of the plurality of distinct portions on the storage device;
performing one or more operations on a respective portion of the storage device;
recording data corresponding to electrical current drawn during performance of the one or more operations on the respective portion of the storage device;
analyzing the recorded data, including determining whether one or more predefined characteristics of the recorded data meets predetermined failure criteria; and
in accordance with a determination that the recorded data meets the predetermined failure criteria, performing one or more remedial actions including updating a mapping of the storage device to mark the respective portion as a known-bad portion.
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Accused Products
Abstract
A method of fault testing in a storage device comprises testing, in accordance with a storage device testing protocol, operability of a plurality of distinct portions on the storage device. The testing includes, for each of the plurality of distinct portions on the storage device: performing one or more operations on a respective portion of the storage device; recording data corresponding to electrical current drawn during performance of the one or more operations on the respective portion of the storage device; analyzing the recorded data, including determining whether one or more predefined characteristics of the recorded data meets predetermined failure criteria; and, in accordance with a determination that the recorded data meets the predetermined failure criteria, performing one or more remedial actions including updating a mapping of the storage device to mark the respective portion as a known-bad portion.
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Citations
24 Claims
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1. A method of fault testing in a storage device, the method comprising:
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testing, in accordance with a storage device testing protocol, operability of a plurality of distinct portions on the storage device; the testing including, for each of the plurality of distinct portions on the storage device; performing one or more operations on a respective portion of the storage device; recording data corresponding to electrical current drawn during performance of the one or more operations on the respective portion of the storage device; analyzing the recorded data, including determining whether one or more predefined characteristics of the recorded data meets predetermined failure criteria; and in accordance with a determination that the recorded data meets the predetermined failure criteria, performing one or more remedial actions including updating a mapping of the storage device to mark the respective portion as a known-bad portion. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15)
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16. A storage device, comprising:
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a storage medium; a storage controller, including one or more processors, coupled to the storage medium, the storage controller configured to; test, in accordance with a storage device testing protocol, operability of a plurality of distinct portions on the storage device; the testing including, for each of the plurality of distinct portions on the storage device; performing one or more operations on a respective portion of the storage device; recording data corresponding to electrical current drawn during performance of the one or more operations on the respective portion of the storage device; analyzing the recorded data, including determining whether one or more predefined characteristics of the recorded data meets predetermined failure criteria; and in accordance with a determination that the recorded data meets the predetermined failure criteria, performing one or more remedial actions including updating a mapping of the storage device to mark the respective portion as a known-bad portion. - View Dependent Claims (17, 18, 19, 20)
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21. A non-transitory computer readable storage medium, storing one or more programs for execution by one or more processors of a storage device, the one or more programs including instructions for:
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testing, in accordance with a storage device testing protocol, operability of a plurality of distinct portions on the storage device; the testing including, for each of the plurality of distinct portions on the storage device; performing one or more operations on a respective portion of the storage device; recording data corresponding to electrical current drawn during performance of the one or more operations on the respective portion of the storage device; analyzing the recorded data, including determining whether one or more predefined characteristics of the recorded data meets predetermined failure criteria; and in accordance with a determination that the recorded data meets the predetermined failure criteria, performing one or more remedial actions including updating a mapping of the storage device to mark the respective portion as a known-bad portion. - View Dependent Claims (22, 23, 24)
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Specification