Angle measuring device and methods for calibration

• US 9,459,121 B2
• Filed: 05/21/2013
• Issued: 10/04/2016
• Est. Priority Date: 05/21/2013
• Status: Active Grant

• Current Assignee: Digipas Technologies, Inc.
• Original Assignee: Digipas USA LLC (Digipas Technologies, Inc.)
• Inventors: Hong, Jim Li Hui, Yong, Kuu Bi
• Primary Examiner(s): GUADALUPE, YARITZA
• Application Number:
  US13/899,266
• Publication Number:
  US 20140350881A1
• Time in Patent Office: 1,232 Days
• Field of Search: 333/661.2, 335/34
• US Class Current: 1/1
• CPC Class Codes: G01C 25/005 initial alignment, calibration or starting-up of inertial devices

Abstract

The invention relates to a method for calibration of 2-axis high precision digital angle measurement device, particularly for initializing a planar angle measuring device and an apparatus to generate simultaneous two-dimensional resultant planar angles of full 360° rotation. The planar angle measurement device is, typically but not exclusively, used in concurrent two-dimensional angles leveling, setting and alignment tasks for precision machine setup in the fields of precision engineering and metrology applications.

Claims

1. A calibration method for simultaneous 2-axis angle measuring device used for leveling and alignment of precision machines and equipment, the said method comprising:

setting a levelled position of a granite table and/or a granite Master Square;

initializing X-sensor reference levelling plane position to granite table position in horizontal front-position and back-position;

initializing Y-sensor reference in vertical plane to front-right position and vertical plane back-left position;

initializing Y-sensor reference in vertical plane front-left position and vertical back-right position;

simultaneously initializing XY-sensors reference planes in both horizontal-front position and horizontal-back position;

initializing and setting the reference leveling planes of all sensors to earth datum.

2. The method of claim 1 wherein the steps of calibrating the measuring device sensors includes:

a 2-axis rotary table planar angle generating apparatus comprising an electronic system unit;

a mechanical frame; and

an X-axis rotary plate and a Y-axis rotary plate attached precisely in tangent to form an unitary embodiment;

wherein each X and Y rotary plates are driven by a motor for generating simultaneous two-dimensional angles of 360°

at high precision; and

wherein the surface of Y-axis rotary plate of the said mechanical frame is leveled by three micrometer adjustment footings to earth datum.

3. The method of claim 2 wherein the 2-axis rotary table apparatus further includes the steps of:

initializing the levelled granite table using the micrometer adjustment footings to attain a levelled X-Y plane with reference to earth datum;

retrieving device sensors reading in consecutive sets of planar angles from the device;

calculate to generate the resultant planar angle to validate device sensor readings;

determine valid readings and auto updating the compensated readings until a full cycle of 360°

for the entire series of XY planes.

4. The method of claim 3 wherein the steps of calibrating the measuring device sensors to include vibration sensors for detecting measuring object'"'"'s vibration magnitude and frequency in X, Y and Z directions.

5. The method of claim 3 wherein the steps of calibrating the measuring device sensors to include object'"'"'s vibration consisting predefined sets of repetitive movement steps including zigzag movements, to excite object vibration and acquire the object vibration amplitude and frequency patterns for accessing object structure positional stability.

6. The method of claim 3 wherein the steps of calibrating the measuring device sensors to include azimuth sensors for detecting angular position change in parallelism measurements.

7. The method of claim 3 wherein the steps of calibrating the measuring device sensors to include a wireless communication device to enable another device accessing and recording planar angles in real time.

8. The method of claim 3 wherein the steps of calibrating the measuring device sensors to include weight and pressure sensors attach to object footings to assess the state of levelled object wherein each footing is taking its proportionate weight in accordance with the object structure.

9. A method for changing a measurement state of an angular measuring device having a 2-axis MEMS tilt sensor, the method comprising:

detecting a 2-dimensional digital angular position of the angular measuring device through the 2 axis MEMS tilt sensor;

activating, automatically, a first measurement mode of the angular measuring device when the angular position detected by the 2 axis MEMS tilt sensor is equal to a first angular position; and

activating, automatically, a second measurement mode of the angular measuring device when the angular position detected by the 2 axis MEMS tilt sensor is equal to a second angular position.

10. The method according to claim 9, wherein the first angular position is a first predefined angular position defining a single axis measurement plane.

11. The method according to claim 10, wherein the first measurement mode is a one-axis measurement mode.

12. The method according to claim 10, wherein the second angular position is a second predefined angular position defining a dual axis measurement plane.

13. The method according to claim 12, wherein the second measurement mode is a two-axis measurement mode.

14. The method according to claim 9, wherein the 2 axis MEMS tilt sensor includes at least one azimuth sensor for detecting angular position changes.

15. An angular measuring device comprising:

a 2-axis MEMS tilt sensor adapted to detect a 2-dimensional digital angular position of the angular measuring device;

a display adapted to display angular position data; and

a processor in communication with the 2 axis MEMS tilt sensor and the display, the processor receiving a signal from the 2 axis MEMS tilt sensor indicative of an angular position of the angular measuring device and automatically operating in a predefined measurement mode based on the 2-dimensional digital angular position of the angular measuring device.

16. The angular measuring device according to claim 15, wherein the processor operates in a one-axis measurement mode when the leveling device is in a first predefined angular position and operates in two-axis measurement mode when the leveling device is in a second predefined angular position.

17. The angular measuring device according to claim 16, wherein the first angular position defines a single axis measurement plane.

18. The angular measuring device according to claim 17, wherein the second angular position defines a dual axis measurement plane.

19. The angular measuring device according to claim 18, wherein the display is adapted to automatically display angular position data in the single axis measurement plane when the angular measuring device is in the first predefined angular position and in the dual axis measurement plane when the angular measuring device is in the second predefined orientation.

20. The angular measuring device according to claim 19, wherein the 2 axis MEMS tilt sensor includes at least one azimuth sensor for detecting angular position changes.