Fourier transform infrared spectrophotometer

• US 9,459,150 B2
• Filed: 02/28/2013
• Issued: 10/04/2016
• Est. Priority Date: 02/28/2013
• Status: Active Grant

• Current Assignee: Shimadzu Corporation
• Original Assignee: Shimadzu Corporation
• Inventors: Fukuda, Hisato
• Primary Examiner(s): Kim, Kiho
• Application Number:
  US14/770,849
• Publication Number:
  US 20160003676A1
• Time in Patent Office: 1,314 Days
• US Class Current: 1/1
• CPC Class Codes: G01J 3/021 using plane or convex mirrors, parallel phase plates, or particular reflectors
• CPC Class Codes: G01J 3/0264 Electrical interface; User interface
• CPC Class Codes: G01J 3/027 Control of working procedures of a spectrometer; Failure detection; Bandwidth calculation
• CPC Class Codes: G01J 3/0275 making use of sensor-related data, e.g. for identification of sensor parts or optical elements
• CPC Class Codes: G01J 3/0289 Field-of-view determination; Aiming or pointing of a spectrometer; Adjusting alignment; Encoding angular position; Size of measurement area; Position tracking
• CPC Class Codes: G01J 3/0297 Constructional arrangements for removing other types of optical noise or for performing calibration
• CPC Class Codes: G01J 3/108 for measurement in the infrared range
• CPC Class Codes: G01J 3/12 Generating the spectrum; Monochromators
• CPC Class Codes: G01J 3/4535 Devices with moving mirror G01J3/4532 takes precedence
• CPC Class Codes: G01N 2021/3595 using FTIR
• CPC Class Codes: G01N 21/35 using infrared light G01N21/39 takes precedence

Abstract

A Fourier transform infrared spectrophotometer that is free from an effect of interference condition change resulting from an accessory being mounted and has a high measurement accuracy is provided. A Fourier transform infrared spectrophotometer according to the present invention is a Fourier transform infrared spectrophotometer including a common base on which a sample chamber 2 and an interference optical system are mounted, where an accessory 20 can be detachably in the sample chamber, the Fourier transform infrared spectrophotometer including: accessory information reading means 22 for reading accessory information provided to the accessory 20 when the accessory 20 is mounted in the sample chamber 2; and setting condition changing means (controller 30) for changing a setting condition for the interference optical system based on the accessory information read by the accessory information reading means 22, the setting condition varying depending on, e.g., a difference in weight between respective accessories 20.

Claims

1. A Fourier transform infrared spectrophotometer comprising:

a) a sample chamber,

b) an accessory detachably installed in the sample chamber to which accessory information representing a type of the accessory is provided,

c) an interference optical system,

d) a common base on which the sample chamber and the interference optical system are mounted;

e) an accessory information reader for reading the accessory information when the accessory is mounted in the sample chamber; and

f) a setting condition changer having a parameter table for changing a setting condition for the interference optical system depending on the accessory based on the accessory information read by the accessory information reader.

2. The Fourier transform infrared spectrophotometer according to claim 1, wherein the setting condition is a parameter for adjusting a direction of a fixed mirror relative to a moving mirror in the interference optical system in which infrared light is divided into two light beams, one of the light beams is reflected by the fixed mirror and the other light beam is reflected by the moving mirror, and the two reflected light beams are then made to interfere with each other.

3. The Fourier transform infrared spectrophotometer according to claim 2, wherein the setting condition is a parameter for setting a luminance of a light source of infrared light to be cast to the sample.

4. The Fourier transform infrared spectrophotometer according to claim 1, wherein the setting condition is a parameter for setting a luminance of a light source of infrared light to be cast to the sample.