Method and apparatus for testing a semiconductor device
First Claim
1. A method, comprising:
- providing a test unit and an electronic circuit that is electrically coupled to the test unit;
performing a multi-dimensional sweeping process, wherein the multi-dimensional sweeping process includes sweeping a plurality of different electrical parameters across their respective ranges;
monitoring a performance of the electronic circuit during the multi-dimensional sweeping process, wherein the monitoring includes identifying optimum values of the different electrical parameters that yield a satisfactory performance of the electronic circuit; and
testing the test unit using the optimum values of the different electrical parameters.
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Abstract
The present disclosure provides a method for testing a semiconductor device. The method includes providing a test unit and an electronic circuit that is electrically coupled to the test unit. The method includes performing a multi-dimensional sweeping process. The multi-dimensional sweeping process includes sweeping a plurality of different electrical parameters across their respective ranges. The method includes monitoring a performance of the electronic circuit during the multi-dimensional sweeping process. The monitoring includes identifying optimum values of the different electrical parameters that yield a satisfactory performance of the electronic circuit. The method includes testing the test unit using the optimum values of the different electrical parameters.
4 Citations
18 Claims
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1. A method, comprising:
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providing a test unit and an electronic circuit that is electrically coupled to the test unit; performing a multi-dimensional sweeping process, wherein the multi-dimensional sweeping process includes sweeping a plurality of different electrical parameters across their respective ranges; monitoring a performance of the electronic circuit during the multi-dimensional sweeping process, wherein the monitoring includes identifying optimum values of the different electrical parameters that yield a satisfactory performance of the electronic circuit; and testing the test unit using the optimum values of the different electrical parameters. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18)
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Specification