Switching film structure for magnetic random access memory (MRAM) cell
First Claim
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1. A magnetic random access memory (MRAM) cell, comprising:
- a magnetic tunneling junction (MTJ) comprising a pin layer, a barrier layer, a free layer, and a capping layer; and
a bidirectional diode selector, comprising a selector electrode directly coupled to the pin layer, and a selector layer directly coupled to the capping layer of the MTJ, to enable access to the MTJ.
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Abstract
An MRAM cell may include a magnetic tunneling junction (MTJ). The MTJ includes a pin layer, a barrier layer, a free layer, and a capping layer. The MRAM cell further includes a bidirectional diode selector, directly coupled to an electrode of the MTJ, to enable access to the MTJ.
25 Citations
18 Claims
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1. A magnetic random access memory (MRAM) cell, comprising:
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a magnetic tunneling junction (MTJ) comprising a pin layer, a barrier layer, a free layer, and a capping layer; and a bidirectional diode selector, comprising a selector electrode directly coupled to the pin layer, and a selector layer directly coupled to the capping layer of the MTJ, to enable access to the MTJ. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9)
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10. A magnetic random access memory (MRAM) cell, comprising:
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a magnetic tunneling junction (MTJ) comprising a pin layer, a barrier layer, a free layer, and a capping layer; and a bi-directionally diode selector, directly coupled to one of the pin layer, the barrier layer, the free layer or the capping layer of the MTJ, in which the bi-directionally diode selector is within an electrode via of the MTJ.
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11. A magnetic random access memory (IVIRAM) cell, comprising:
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a magnetic tunneling junction (MTJ) comprising a pin layer, a barrier layer, a free layer, and a capping layer; and means for bi-directionally accessing the MTJ, in which the means for bi-directionally accessing comprises a selector electrode directly coupled to the pin layer, and a selector layer directly coupled to the capping layer of the MTJ. - View Dependent Claims (12, 13, 14)
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15. A method for storing data in a magnetic random access memory (MRAM) cell, comprising:
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a step for storing a memory bit in a magnetic tunneling junction (MTJ) device, the MTJ device comprising a pin layer, a barrier layer, a free layer, and a capping layer; and a step for accessing the MTJ device with a selector electrode directly coupled to the pin layer, and a selector layer directly coupled to the capping layer of the MTJ. - View Dependent Claims (16)
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17. A method for storing data in a magnetic random access memory (MRAM) cell, comprising:
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storing a memory bit in a magnetic tunneling junction (MTJ) device, the MTJ device comprising a pin layer, a barrier layer, a free layer, and a capping layer; and accessing the MTJ device with a selector electrode directly coupled to the pin layer, and a selector layer directly coupled to the capping layer of the MTJ. - View Dependent Claims (18)
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Specification