Capacitive pressure sensors for high temperature applications
First Claim
Patent Images
1. A capacitive pressure sensor, comprising:
- a substrate wafer defining a main substrate recess and having a first electrode;
a diaphragm wafer defining a main diaphragm recess and having a second electrode;
one of the substrate and diaphragm wafers defining an independent via recess, wherein the diaphragm wafer is bonded to the substrate wafer such that the substrate and diaphragm recesses form a height differentiated pressure chamber, and the via recess forms a via chamber,wherein a depth of the via recess is less than a depth of the corresponding main recess in the same wafer.
0 Assignments
0 Petitions
Accused Products
Abstract
A capacitive pressure sensor includes a substrate wafer and a diaphragm wafer. The substrate wafer defines a substrate recess with a first recess. The diaphragm wafer defines a diaphragm recess with a second recess. The diaphragm wafer is bonded to the substrate wafer such that the substrate and diaphragm recesses form a height differentiated pressure chamber.
-
Citations
14 Claims
-
1. A capacitive pressure sensor, comprising:
-
a substrate wafer defining a main substrate recess and having a first electrode; a diaphragm wafer defining a main diaphragm recess and having a second electrode; one of the substrate and diaphragm wafers defining an independent via recess, wherein the diaphragm wafer is bonded to the substrate wafer such that the substrate and diaphragm recesses form a height differentiated pressure chamber, and the via recess forms a via chamber, wherein a depth of the via recess is less than a depth of the corresponding main recess in the same wafer. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11)
-
-
12. A method of making a capacitive pressure sensor, comprising:
-
defining a differentiated height substrate recess in a substrate wafer; defining a diaphragm recess in a diaphragm wafer; defining a via recess in one of the diaphragm and substrate wafers; bonding the substrate wafer to the diaphragm wafer such that the differentiated height substrate recess and diaphragm recess form a height differentiated pressure chamber with a via chamber; and forming a via extending through the substrate wafer and into the via chamber. - View Dependent Claims (13, 14)
-
Specification