Systems and methods for implementing S/SSTDR measurements

• US 9,476,932 B2
• Filed: 01/21/2016
• Issued: 10/25/2016
• Est. Priority Date: 03/15/2013
• Status: Active Grant

• Current Assignee: University of Utah Research Foundation (State of Utah)
• Original Assignee: University of Utah Research Foundation (State of Utah)
• Inventors: Furse, Cynthia, Khan, Faisal
• Primary Examiner(s): LE, SON T
• Application Number:
  US15/002,704
• Publication Number:
  US 20160169957A1
• Time in Patent Office: 278 Days
• US Class Current: 1/1
• CPC Class Codes: G01R 27/02 Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant by measuring phase angle only G01R25/00
• CPC Class Codes: G01R 27/06 Measuring reflection coefficients; Measuring standing-wave ratio
• CPC Class Codes: G01R 31/008 on air- or spacecraft, railway rolling stock or sea-going vessels
• CPC Class Codes: G01R 31/11 using pulse reflection methods
• CPC Class Codes: G01R 31/2841 Signal generators
• CPC Class Codes: G01R 31/2879 related to electrical aspects, e.g. to voltage or current supply or stimuli or to electrical loads

Abstract

Systems and methods which utilize spread spectrum sensing on live circuits to obtain information regarding a circuit under test are provided. In some embodiments S/SSTDR testing may be utilized to obtain R, L, C and Z measurements from circuit components. In yet further embodiments, these measurements may be utilized to monitor the output of sensors on a circuit.

Claims

1. A method comprising:

transmitting plural spread spectrum time domain reflectometry (S/SSTDR) signals onto a signal path of an electronic circuit;

receiving plural reflections of the S/SSTDR signals from a known impedance within the electronic circuit;

receiving plural reflections of the S/SSTDR signals from an unknown component of the electronic circuit; and

processing the reflected signals from the known impedance and the reflections from the unknown component to determine an electrical property of an element of the electronic circuit.

2. The method of claim 1 wherein the unknown component is the element of the electronic circuit.

3. The method of claim 1 further comprising determining a state of a sensor residing in the electronic circuit based on the determined electrical property.

4. The method of claim 1 further comprising transmitting the S/SSTDR signals to plural signal paths of the electronic circuit simultaneously.

5. The method of claim 4 wherein the S/SSTDR signals are configured to be non-interfering with each other and with existing signals within the electronic circuit.

6. The method of claim 1 wherein a plurality of components in the electrical circuit are grouped into functional blocks and one of the functional blocks is the element of the electronic circuit.

7. The method of claim 1 further comprising processing the reflected signals to determine the location of the element of the electronic circuit.

8. The method of claim 1 further comprising processing the reflected signals to determine velocity of propagation of a transmission line in the electrical circuit.

9. An apparatus comprising:

at least one processing device configured to;

transmit plural spread spectrum time domain reflectometry (S/SSTDR) signals onto a signal path of an electronic circuit;

receive plural reflections of the S/SSTDR signals from a known impedance within the electronic circuit;

receive plural reflections of the S/SSTDR signals from an unknown component of the electronic circuit; and

process the reflected signals from the known impedance and the reflected signals from the unknown component to determine an electrical property of an element of the electronic circuit.

10. The method of claim 9 wherein the unknown component is the element of the electronic circuit.

11. The apparatus of claim 9 wherein a plurality of components in the electrical circuit are grouped into functional blocks and one of the functional blocks is the element of the electronic circuit.

12. The apparatus of claim 9 wherein the at least one processing device is configured to transmit to plural signal paths of the electronic circuit simultaneously.

13. The apparatus of claim 12 wherein the S/SSTDR signals are configured to be non-interfering with each other and with existing signals within the electronic circuit.

14. The apparatus of claim 9 wherein the at least one processing device is further configured to detect at least one of an arc fault and ground fault.

15. The apparatus of claim 9 wherein the at least one processing device is further configured to process the reflected signals to determine the location of the element of the electronic circuit.

16. The apparatus of claim 9 wherein the at least one processing device is further configured to process the reflected signals to determine velocity of propagation of a transmission line.

17. An apparatus comprising:

at least one processing device configured to form S/SSTDR test signals; and

plural input/output ports configured to communicatively connect to a target to be tested;

wherein the at least one processing device is configured to simultaneously;

transmit plural spread spectrum time domain reflectometry (S/SSTDR) signals onto plural signal paths of an electronic circuit;

receive plural reflections of the S/SSTDR signals from a known impedance within the electronic circuit;

receive plural reflections of the S/SSTDR signals from an unknown component of the electronic circuit; and

process the reflected signals from the known impedance and the reflected signals from the unknown component to determine an electrical property of an element of the electronic circuit.

18. The apparatus of claim 17 wherein the at least one processing device is further configured to analyze the reflected signals to determine the state of a winding component of a circuit.

19. The apparatus of claim 17 wherein the at least one processing device is further configured to analyze the reflected signals to determine if at least one of a ground fault and arc fault is present.

20. The apparatus of claim 17 wherein the at least one processing device is further configured to analyze the reflected signals to determine at least one of a resistance, capacitance, inductance, impedance, location and velocity of propagation.