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Diagnosing multipath interference and eliminating multipath interference in 3D scanners by directed probing

  • US 9,482,514 B2
  • Filed: 12/23/2013
  • Issued: 11/01/2016
  • Est. Priority Date: 03/15/2013
  • Status: Expired due to Fees
First Claim
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1. A method of object measurement to determine three-dimensional (3D) coordinates of points on a surface of an object, the method comprising:

  • providing a remote probe having a probe tip and at least three non-collinear target spots, the probe tip having a spherical shape, the spherical shape having a sphere center, the target spots having a target set of 3D coordinates of the target spots;

    providing a 3D coordinate measurement device that includes a projector and a camera, the projector and the camera being fixed in relation to one another, there being a baseline distance between the projector and the camera, the projector including a light source configured to emit a projected light having any of a plurality of patterns, the camera including a lens and a photosensitive array, the camera having a camera field of view, the lens configured to image a reflected portion of the projected light that is within the camera field of view onto the photosensitive array and to produce an electrical signal in response;

    providing a processor electrically coupled to the projector and the camera;

    selecting by the processor a first pattern from among the plurality of patterns;

    emitting from the projector onto the surface, in a first instance, a first projected light having the first pattern;

    reflecting into the camera a portion of the first projected light as a first reflected light;

    forming with the lens a first image of the first reflected light on the photosensitive array and producing a first electrical signal in response;

    determining with the processor a first set of 3D coordinates of first points on the surface, the first set based at least in part on the first pattern, the first electrical signal and the baseline distance;

    determining with the processor a first susceptibility of an object measurement to multipath interference, the first susceptibility based at least in part on a simulation in which the processor projects first rays from the projector to the first points and calculates an angle of reflection from each of the first points for each of the corresponding first rays;

    selecting with the processor a second pattern from among the plurality of patterns and a first location on the surface, the second pattern and the first location based at least in part on the first susceptibility;

    emitting, in a second instance, from the projector onto the surface at the first location a second projected light having the second pattern;

    moving by an operator, in response to the second projected light, the remote probe and contacting the probe tip to the surface proximate the first location, the probe tip having a first sphere center when the probe tip is contacting the surface;

    illuminating the target spots;

    forming with the lens a second image of the illuminated target spots on the photosensitive array and producing a second electrical signal in response;

    determining second 3D coordinates of the first sphere center, the second 3D coordinates based at least in part on the second image, the target set, and the baseline distance; and

    storing the second 3D coordinates.

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