Method for integrated circuit mask patterning
First Claim
1. A method, comprising the steps of:
- providing an integrated circuit (IC) design layout, the IC design layout having a first IC pattern that is not in one of predefined shapes;
using a computer, deriving a second IC pattern approximating the first IC pattern, wherein the second IC pattern is in one of the predefined shapes;
calculating a pattern approximation error between the first IC pattern and the second IC pattern; and
upon a condition in which the pattern approximation error is less than a threshold, replacing the first IC pattern with the second IC pattern in the IC design layout.
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Accused Products
Abstract
Provided is a method of transforming an integrated circuit (IC) pattern into one or more patterns suitable for subsequent processing, such as mask fabrication. The method includes receiving an IC pattern that has an arbitrary shape, and using a computer, deriving an approximation IC pattern that is a user-defined fabrication-friendly shape, such as a rectangle or an ellipse. The method further includes calculating a pattern approximation error between the IC pattern and the approximation IC pattern. The method further includes checking whether the pattern approximation error is less than a user-defined threshold. If it is, the method further includes replacing the IC pattern with the approximation IC pattern for subsequent fabrication. Otherwise, the method further includes splitting the IC pattern into subparts, and recursively transforming each of the subparts.
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Citations
20 Claims
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1. A method, comprising the steps of:
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providing an integrated circuit (IC) design layout, the IC design layout having a first IC pattern that is not in one of predefined shapes; using a computer, deriving a second IC pattern approximating the first IC pattern, wherein the second IC pattern is in one of the predefined shapes; calculating a pattern approximation error between the first IC pattern and the second IC pattern; and upon a condition in which the pattern approximation error is less than a threshold, replacing the first IC pattern with the second IC pattern in the IC design layout. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10)
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11. A method, comprising:
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providing an integrated circuit (IC) pattern that is not a rectangular shape; using a computer, determining a rectangle approximating the IC pattern, wherein the rectangle and the IC pattern share a center of mass; calculating a pattern approximation error between the rectangle and the IC pattern; and when the pattern approximation error is less than a user-defined threshold, accepting the rectangle as a replacement of the IC pattern in subsequent IC fabrication. - View Dependent Claims (12, 13, 14, 15, 16, 17)
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18. A method, comprising the steps of:
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receiving an integrated circuit (IC) design layout, the IC design layout having a first pattern that is not in fabrication-friendly shapes; using a computer, determining a second pattern approximating the first pattern, wherein the second pattern is in the fabrication-friendly shapes; calculating a deviation between the first pattern and the second pattern; and upon a condition in which the deviation is greater than a threshold, performing the steps of; splitting the first pattern into subparts; and for each of the subparts, recursively performing the steps of determining, calculating, and conditionally splitting. - View Dependent Claims (19, 20)
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Specification