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CMOS ultrasonic transducers and related apparatus and methods

  • US 9,499,392 B2
  • Filed: 02/04/2014
  • Issued: 11/22/2016
  • Est. Priority Date: 02/05/2013
  • Status: Active Grant
First Claim
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1. A method comprising:

  • depositing a first conductive layer on a silicon wafer;

    depositing a second conductive layer on the first conductive layer;

    depositing a first layer of SiO2 on the second conductive layer;

    etching at least one cavity in the first layer of SiO2, a bottom surface of the at least one cavity corresponding to the second conductive layer;

    depositing a second layer of SiO2 on the first layer of SiO2;

    planarizing the second layer of SiO2;

    bonding a second wafer comprising silicon to the silicon wafer with a fusion bond;

    thinning a backside of the second wafer distal the at least one cavity to form a membrane over the at least one cavity; and

    depositing a third conductive layer on the membrane.

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