Configuration of semiconductor device supply voltage

• US 9,502,956 B1
• Filed: 12/18/2013
• Issued: 11/22/2016
• Est. Priority Date: 12/19/2012
• Status: Active Grant

• Current Assignee: Marvell Asia Pte Limited (Marvell Technology Group Limited)
• Original Assignee: ClariPhy Communications Incorporated (Inphi Corporation)
• Inventors: Yeo, Michael, Swenson, Norman L.
• Primary Examiner(s): Phan, Huy Q
• Assistant Examiner(s): Russo, Paul Rios
• Application Number:
  US14/133,552
• Time in Patent Office: 1,070 Days
• Field of Search: 324/71, 324/378, 324/403, 324/415, 324/425, 324/500, 324/537, 324/762.01
• US Class Current: 1/1
• CPC Class Codes: G01R 31/26 Testing of individual semiconductor devices testing or measuring during manufacture or treatment H01L22/00; testing of photovoltaic devices H02S50/10
• CPC Class Codes: G01R 31/2642 Testing semiconductor operation lifetime or reliability, e.g. by accelerated life tests
• CPC Class Codes: G01R 31/2648 Characterising semiconductor materials testing of materials or semi-finished products G01R31/2831; testing during manufacture H01L22/00
• CPC Class Codes: G01R 31/2831 Testing of materials or semi-finished products, e.g. semiconductor wafers or substrates G01R31/318511 takes precedence; testing during manufacture H01L22/00
• CPC Class Codes: G01R 31/2851 Testing of integrated circuits [IC] G01R31/317 takes precedence; testing individual devices G01R31/26; testing printed circuits G01R31/2801
• CPC Class Codes: G01R 31/3004 Current or voltage test
• CPC Class Codes: G01R 31/3172 Optimisation aspects, e.g. using functional pin as test pin, pin multiplexing
• CPC Class Codes: H02M 1/36 Means for starting or stopping converters

Abstract

A calibration process determines a desired supply voltage for operating an electronic device. During the calibration process automatic test equipment controls a power supply to sweep the supply voltage to the electronic device across a predefined voltage range while monitoring a performance characteristic of the electronic device. The automatic test equipment determines the desired operating voltage based on a minimum supply voltage at which the monitored performance characteristic meets a minimum acceptable performance standard and stores the desired operating voltage to a non-volatile storage. During a startup sequence, the electronic device controls the power supply to provide the desired operating voltage as the supply voltage to the electronic device.

Claims

1. A method for determining a supply voltage for operating an electronic device of an integrated circuit, the method comprising:

sweeping the supply voltage across a voltage range;

monitoring a performance characteristic of the electronic device at a plurality of different time points while sweeping the supply voltage across the voltage range, wherein monitoring the performance characteristic at a given time point of the plurality of different time points comprises;

counting a number of cycles of a first clock signal;

counting of a number of cycles of a second clock signal;

generating an indicator signal responsive to a threshold number of cycles of the first clock signal being reached;

stopping counting of the number of cycles of the second clock signal responsive to the indicator signal indicating that the threshold number of cycles of the first clock signal has been reached; and

outputting the number of clock cycles of the second clock signal counted prior to the indicator signal being generated as the performance characteristic associated with the given time point;

identifying a minimum voltage at which the performance characteristic achieves a predefined performance level; and

storing the identified minimum voltage to a register of the electronic device.

2. The method of claim 1, wherein sweeping the supply voltage across the voltage range comprises:

sweeping the supply voltage from a minimum voltage of the voltage range to a maximum voltage of the voltage range.

3. The method of claim 1, wherein sweeping the supply voltage across the voltage range comprises:

sweeping the supply voltage from a maximum voltage of the voltage range to a minimum voltage of the voltage range.

4. The method of claim 1, wherein monitoring the performance characteristic of the electronic device comprises:

measuring an oscillation speed of a ring oscillator in the integrated circuit.

5. The method of claim 1, further comprising:

determining the predefined performance level based on a static timing analysis of the electronic device.

6. The method of claim 1, wherein the register comprises a non-volatile memory.

7. The method of claim 1 wherein the first clock signal comprises a ring oscillator clock signal generated by a ring oscillator, and wherein the second clock signal comprises an external reference clock signal.

8. The method of claim 1, wherein the second clock signal comprises a ring oscillator clock signal generated by a ring oscillator, and wherein the first clock signal comprises an external reference clock signal.

9. The method of claim 1, wherein counting the number of cycles of the first clock signal comprises using a first counter to count down to zero from a first seed value, and wherein counting the number of cycle of the second clock signal comprises using a second counter to count down from a second seed value, the indicator signal being asserted when the first counter reaches zero.

10. The method of claim 9, wherein outputting the performance characteristics comprises:

outputting a first predefined value responsive to the second counter being zero when the first counter reaches zero; and

outputting a second predefined value responsive to the second counter being a non-zero value when the first counter reaches zero.

11. The method of claim 9, wherein outputting the performance characteristic comprises:

outputting a value of the second counter when the first counter reaches zero.

12. An electronic system, comprising:

an electronic device of an integrated circuit;

a power supply to provide a supply voltage to the electronic device;

a process monitor of the integrated circuit, the process monitor to monitor a performance characteristic of the electronic device at a plurality of different time points, wherein the process monitor comprises;

a first counter to count a number of cycles of a first clock signal and to output an indicator signal responsive to a threshold number of cycles of the first clock signal being reached;

a second counter to count a number of cycles of a second clock signal and to stop counting responsive to the indicator signal indicating that the threshold number of cycles of the first clock signal has been reached, and to output the number of clock cycles of the second clock signal counted prior to the indicator signal being generated as the performance characteristics associated with the given time point; and

automatic test equipment to control the power supply to sweep the supply voltage to the electronic device across a predefined voltage range, and to receive the performance characteristic of the electronic device while sweeping the supply voltage, the automatic test equipment to determine a desired operating voltage based on a minimum supply voltage at which the performance characteristic meets a minimum acceptable performance standard;

a storage of the integrated circuit to store the desired operating voltage.

13. The electronic system of claim 12, wherein the automatic testing equipment sweeps the supply voltage from a minimum voltage of the voltage range to a maximum voltage of the voltage range.

14. The electronic system of claim 12, wherein the automatic testing equipment sweeps the supply voltage from a maximum voltage of the voltage range to a minimum voltage of the voltage range.

15. The electronic system of claim 12, wherein the process monitor comprises:

a ring oscillator to provide an oscillating signal, wherein the performance characteristic comprises a speed of the oscillating signal.

16. The electronic system of claim 12, wherein the storage comprises a non-volatile storage.

17. The electronic system of claim 12, wherein the electronic device is configured to execute a startup sequence upon power on, the startup sequence comprising steps of:

initializing the supply voltage to the electronic device to an initial voltage, the initial voltage above the desired operating voltage for the electronic device;

reading the desired operating voltage for the electronic device from the storage; and

configuring the power supply to provide the desired operating voltage as the supply voltage to the electronic device.

18. The electronic system of claim 12, wherein the process monitor further comprises:

a ring oscillator to generate the first clock signal; and

wherein the second clock signal comprises an external reference clock signal.

19. The electronic system of claim 12, further comprising:

a ring oscillator to generate the second clock signal; and

wherein the first clock signal comprises an external reference clock signal.

20. The electronic system of claim 12, wherein first counter is configured to count down from a first seed value, and wherein the second counter is configured to count down from a second seed value, the indicator signal being asserted when the first counter reaches zero.

21. The electronic system of claim 12, wherein the reference clock counter is further configured to:

output a first predefined value responsive to the second counter being zero when the first counter reaches zero; and

output a second predefined value responsive to the second counter being a non-zero value when the first counter reaches zero.

22. The electronic system of claim 12, wherein the second counter is further configured to output a value of the second counter when the first counter reaches zero.