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Active probe card

  • US 9,506,974 B2
  • Filed: 09/03/2014
  • Issued: 11/29/2016
  • Est. Priority Date: 01/24/2014
  • Status: Active Grant
First Claim
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1. An active probe card for improving testing bandwidth of a device under test (DUT), comprising:

  • a printed circuit board;

    at least one probe needle, affixed to a first surface of the printed circuit board for probing the DUT;

    at least one connection member, electrically connected to the at least one probe needle;

    an amplification circuit, formed on the printed circuit board and coupled to the at least one connection member for amplifying an input signal of the DUT; and

    at least one affixing unit, for affixing the at least one probe needle to the first surface of the printed circuit board, wherein a material of the affixing unit is a ceramic material or an electrically insulating plastic material;

    wherein the amplification circuit comprises;

    a differential operational amplifier or a single-ended operational amplifier;

    or a differential comparator or a single-ended comparator;

    or an equalizer;

    wherein the equalizer has at least one of a pre-emphasis function and a de-emphasis function, the pre-emphasis function provides a first amplification factor, the de-emphasis function provides a second amplification factor, the first amplification factor is greater than the second amplification factor, and the first amplification factor and the second amplification factor are programmable or fixed values.

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