Active probe card
First Claim
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1. An active probe card for improving testing bandwidth of a device under test (DUT), comprising:
- a printed circuit board;
at least one probe needle, affixed to a first surface of the printed circuit board for probing the DUT;
at least one connection member, electrically connected to the at least one probe needle;
an amplification circuit, formed on the printed circuit board and coupled to the at least one connection member for amplifying an input signal of the DUT; and
at least one affixing unit, for affixing the at least one probe needle to the first surface of the printed circuit board, wherein a material of the affixing unit is a ceramic material or an electrically insulating plastic material;
wherein the amplification circuit comprises;
a differential operational amplifier or a single-ended operational amplifier;
or a differential comparator or a single-ended comparator;
or an equalizer;
wherein the equalizer has at least one of a pre-emphasis function and a de-emphasis function, the pre-emphasis function provides a first amplification factor, the de-emphasis function provides a second amplification factor, the first amplification factor is greater than the second amplification factor, and the first amplification factor and the second amplification factor are programmable or fixed values.
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Abstract
An active probe card capable of improving testing bandwidth of a device under (DUT) test includes a printed circuit board; at least one probe needle, affixed to a first surface of the printed circuit board for probing the DUT; at least one connection member, electrically connected to the at least one probe needle; and an amplification circuit, formed on the printed circuit board and coupled to the at least one connection member for amplifying an input or output signal of the DUT.
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Citations
6 Claims
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1. An active probe card for improving testing bandwidth of a device under test (DUT), comprising:
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a printed circuit board; at least one probe needle, affixed to a first surface of the printed circuit board for probing the DUT; at least one connection member, electrically connected to the at least one probe needle; an amplification circuit, formed on the printed circuit board and coupled to the at least one connection member for amplifying an input signal of the DUT; and at least one affixing unit, for affixing the at least one probe needle to the first surface of the printed circuit board, wherein a material of the affixing unit is a ceramic material or an electrically insulating plastic material; wherein the amplification circuit comprises; a differential operational amplifier or a single-ended operational amplifier;
or a differential comparator or a single-ended comparator;
or an equalizer;wherein the equalizer has at least one of a pre-emphasis function and a de-emphasis function, the pre-emphasis function provides a first amplification factor, the de-emphasis function provides a second amplification factor, the first amplification factor is greater than the second amplification factor, and the first amplification factor and the second amplification factor are programmable or fixed values. - View Dependent Claims (2, 3, 4, 5, 6)
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Specification