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Electrical test device and method

  • US 9,513,320 B2
  • Filed: 04/27/2015
  • Issued: 12/06/2016
  • Est. Priority Date: 12/22/1992
  • Status: Expired due to Term
First Claim
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1. An electrical test device adapted to apply current to an electrical system during measurement of a plurality of parameters, comprising:

  • a power supply connected to an external power source;

    a conductive probe element configured to be energized by the power supply, the probe element being configured to be placed in contact with an electrical system and apply to the electrical system an input signal containing current for measuring at least one parameter of the electrical system; and

    a spectral analysis block connected to the probe element and being configured to perform the following;

    receive an output signal from the electrical system in response to application of the input signal;

    analyze a frequency spectra of the output signal, the frequency spectra having a low-frequency portion and a high-frequency portion and containing energy contributed by the periodic and non-periodic signals,analyze the low-frequency portion and detect the potential occurrence of arcing in the electrical system when the energy contributed by the non-periodic signals in the low-frequency portion exceeds a predetermined energy threshold,responsive to the energy in the low-frequency portion exceeding the predetermined energy threshold, detect the occurrence of arcing in the electrical system when the energy in the high-frequency portion exceeds the energy threshold.

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