Built-in self-test for receiver
First Claim
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1. A self-test apparatus, comprising:
- a radio frequency (RF) phase-locked loop (PLL) device arranged to generate a local oscillator (LO) signal;
a divider component arranged to divide a frequency of the LO signal by an integer value to produce a modulation frequency; and
a modulation component arranged to modulate the LO signal at the modulation frequency to produce a test signal arranged to test a system-on-chip (SoC) communication device that includes the self-test apparatus.
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Abstract
Representative implementations of devices and techniques provide a built-in self-test for a RF communication device. The communication device self-generates a test signal and processes the test signal through the communication device to determine an operational state of the communication device.
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Citations
19 Claims
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1. A self-test apparatus, comprising:
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a radio frequency (RF) phase-locked loop (PLL) device arranged to generate a local oscillator (LO) signal; a divider component arranged to divide a frequency of the LO signal by an integer value to produce a modulation frequency; and a modulation component arranged to modulate the LO signal at the modulation frequency to produce a test signal arranged to test a system-on-chip (SoC) communication device that includes the self-test apparatus. - View Dependent Claims (2, 3, 4, 5, 6)
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7. A system-on-chip (SoC) implemented radio frequency (RF) communication device, comprising:
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a RF portion, including; a single radio frequency (RF) phase-locked loop (PLL) device arranged to generate a local oscillator (LO) signal; a divider component arranged to divide a frequency of the LO signal by an integer value to produce a modulation frequency; a modulation component arranged to modulate the LO signal at the modulation frequency to produce a test signal and to output the test signal, the test signal arranged to test the RF communication device; and a front end portion arranged to receive and to down-convert the test signal to form a converted test signal; and a baseband portion, including; one or more correlators arranged to analyze the converted test signal to determine an operational state of the RF communication device. - View Dependent Claims (8, 9, 10, 11, 12)
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13. A method, comprising:
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generating a local oscillator (LO) signal at a receiver of an RF communication device having a single phase-locked loop (PLL) device; dividing a frequency of the LO signal by an integer value to produce a modulation frequency; modulating the LO signal at the modulation frequency to produce a radio frequency (RF) test signal; processing the test signal with the receiver to test an operational state of the RF communication device, the processing producing a resulting signal at the receiver; and analyzing the resulting signal at the receiver to determine the operational state of the RF communication device. - View Dependent Claims (14, 15, 16, 17, 18, 19)
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Specification