X-ray detection apparatus

• US 9,519,068 B2
• Filed: 11/08/2012
• Issued: 12/13/2016
• Est. Priority Date: 11/08/2011
• Status: Expired due to Fees

• Current Assignee: IBEX Innovations Ltd.
• Original Assignee: IBEX Innovations Ltd.
• Inventors: Gibson, Gary
• Primary Examiner(s): Makiya, David J
• Assistant Examiner(s): FOX, DANIELLE A
• Application Number:
  US14/356,920
• Publication Number:
  US 20140321616A1
• Time in Patent Office: 1,496 Days
• US Class Current: 1/1
• CPC Class Codes: G01N 23/04 and forming images of the material
• CPC Class Codes: G01T 1/20 with scintillation detectors
• CPC Class Codes: G01T 1/2985 In depth localisation, e.g. using positron emitters; Tomographic imaging (longitudinal and transverse section imaging; apparatus for radiation diagnosis sequentially in different planes, steroscopic radiation diagnosis); using external radiation sources A61B6/02

Abstract

X-ray imaging apparatus, which includes an x-ray detector. The x-ray detector comprises a member configured to convert incident x-ray wavelength photons into emitted visible wavelength photons, a position for a material under test, an x-ray source, and a structure configured to perturb an x-ray energy spectrum, each lying on a common axis. The x-ray source is arranged to direct an x-ray energy spectrum along the common axis to impinge upon the member, the structure configured to perturb the x-ray energy spectrum, and positioned material under test. The structure lies between the x-ray source and the member to one side of the position for material under test intersecting the common axis, and the said structure comprises at least three adjacent regions, each region different to immediately adjacent regions and configured to perturb the x-ray energy spectrum differently.

Claims

1. X-ray imaging and materials identification apparatus, the apparatus including an x-ray detector comprising:

a single member configured to convert incident x-ray wavelength photons into emitted visible wavelength photons,

a position for a material under test,

an x-ray source, and

a structure configured to perturb an x-ray energy spectrum, wherein the single member, the position for a material under test, the x-ray source, and the structure configured to perturb an x-ray energy spectrum each lie on a common axis, wherein;

the x-ray source is arranged to direct an x-ray energy spectrum along the common axis to impinge upon the member, the structure configured to perturb the x-ray energy spectrum, and the position for material under test,

said structure lies between the x-ray source and the single member to one side of the position for material under test intersecting the common axis,

the structure configured to perturb an x-ray energy spectrum comprises at least three adjacent regions, each different from each other and having a different x-ray energy spectrum perturbing characteristic, and

a difference between adjacent regions of the structure configured to perturb the x-ray energy spectrum includes the thickness of the material of the structure in adjacent regions.

2. X-ray imaging apparatus according to claim 1, wherein the member configured to convert incident x-ray wavelength photons into emitted visible wavelength photons is a scintillator.

3. X-ray imaging apparatus according to claim 2, wherein the scintillator includes a scintillator layer and a backing layer.

4. An x-ray imaging apparatus according to claim 1, wherein the at least three regions are formed in an array.

5. An x-ray imaging apparatus according to claim 4, wherein the array comprises an x by y array wherein the multiple of x and y is not fewer than three.

6. An x-ray imaging apparatus according to claim 4, wherein the array repeats itself in the structure.

7. An x-ray imaging apparatus according to claim 4, wherein the structure includes a multiplicity of arrays.

8. An x-ray imaging apparatus according to claim 1, wherein the structure is one of:

planar and non-planar.

9. An x-ray imaging apparatus according to claim 8, wherein the structure is curved in at least one plane.

10. An x-ray imaging apparatus according to claim 1, wherein the difference between adjacent regions of the structure configured to perturb the x-ray energy spectrum also includes a material from which the individual adjacent regions of the structure are formed.

11. An x-ray imaging apparatus according to claim 10, wherein the individual regions of the structure include discrete layers.

12. An x-ray imaging apparatus according to claim 11, wherein the discrete layers differ and the difference between discrete layers is selected from the group comprising:

the discrete layers differ in their thicknesses between regions;

the discrete layers differ in their thicknesses within a region;

the discrete layers differ in the materials from which they are formed between regions;

the discrete layers differ in the materials from which they are formed within a region;

the discrete layers differ in their numbers between regions; and

the discrete layers differ in their numbers within a region.

13. An x-ray imaging apparatus according to claim 10, wherein the structure includes a plurality of discrete layers and at least one of the discrete layers includes at least one aperture.

14. An x-ray imaging apparatus according to claim 13, wherein the discrete layers each include at least one aperture and wherein apertures of different layers within the structure are of different dimensions.

15. An x-ray imaging apparatus according to claim 12, wherein the discrete layers are formed of one of:

foil and mesh.

16. An x-ray imaging apparatus according to claim 10, wherein the structure changes in thickness continuously across the structure in at least one direction.

17. An x-ray imaging apparatus according to claim 16, wherein the structure changes in thickness continuously across the structure in two orthogonal directions.

18. An x-ray imaging apparatus according to claim 10, wherein the structure includes one of:

a plurality of protrusions and a plurality of depressions, a thickness of said protrusions and depressions changing in at least one direction thereof, each protrusion and depression providing the at least three adjacent regions configured to perturb the x-ray energy spectrum.

19. An x-ray imaging apparatus according to claim 18, wherein the protrusions and depressions are pyramidal in shape.

20. An x-ray imaging apparatus according to claim 19, wherein the structure comprises a non-metallic layer having a multiplicity of depressions formed therein, each depression filled with metal.

21. An x-ray imaging apparatus according to claim 20, wherein the structure comprises a first non-metallic layer having a multiplicity of depressions formed therein and a second metallic layer including a corresponding number of protrusions each protrusion mating with a corresponding depression.

22. An x-ray imaging apparatus according to claim 21, wherein the second layer covers the surface of the first layer in which the openings to the depressions are situated.

23. An x-ray imaging apparatus according to claim 19, wherein adjacent depressions and protrusions are separated from one another by x-ray perturbing material and wherein the material separating adjacent depressions and protrusions constitute one of the at least three adjacent regions.

24. An x-ray imaging apparatus according to claim 20, wherein the non-metallic layer is formed of silicon.

25. An x-ray imaging apparatus according to claim 20, wherein the structure comprises a substrate and the said plurality of regions are one of:

formed in the substrate;

formed on the substrate; and

formed in and on the substrate.

26. An x-ray imaging apparatus according to claim 2, wherein the scintillator is formed of a scintillator material having one of a flat energy dependence and a non-flat energy dependence.

27. An x-ray detector suitable for use in an x-ray imaging and materials identification apparatus according to claim 1, wherein the x-ray detector comprises a single member configured to convert incident x-ray wavelength photons into emitted visible wavelength photons and a separate structure for alignment with an x-ray energy spectrum source, the structure configured to perturb the x-ray energy spectrum, and the structure comprising at least three regions, each different from each other and having a different x-ray energy spectrum perturbing characteristic.