Multi-layer flat panel X-ray detector

• US 9,526,466 B2
• Filed: 07/16/2010
• Issued: 12/27/2016
• Est. Priority Date: 07/16/2009
• Status: Active Grant

• Current Assignee: University of Waikato
• Original Assignee: University of Waikato
• Inventors: Karim, Karim S., Allec, Nicholas
• Primary Examiner(s): Makiya, David J
• Assistant Examiner(s): FOX, DANIELLE A
• Application Number:
  US13/380,127
• Publication Number:
  US 20120106698A1
• Time in Patent Office: 2,356 Days
• US Class Current: 1/1
• CPC Class Codes: A61B 6/4241 using energy resolving detectors, e.g. photon counting
• CPC Class Codes: A61B 6/4488 Means for cooling A61B6/045 takes precedence
• CPC Class Codes: A61B 6/482 involving multiple energy imaging
• CPC Class Codes: A61B 6/502 for diagnosis of breast, i.e. mammography
• CPC Class Codes: G01T 1/2928 using solid state detectors
• CPC Class Codes: H01L 27/14663 Indirect radiation imagers, e.g. using luminescent members

Abstract

There is provided a multi-layer flat panel detector comprising a first conversion layer, a second conversion layer, at least one printed circuit board for receiving signals generated by the first or second direct conversion layers, and a processor for processing the signals to produce an image being generated.

Claims

1. A multi-layer flat panel detector for digital X-ray imaging comprising:

a single substrate layer;

a first conversion layer configured to detect radiation from an x-ray source including a first conversion layer conversion material layer and a first conversion layer pixel layer, the first conversion layer on a first side of the single substrate layer;

a second conversion layer configured to detect radiation from the x-ray source including a second conversion layer conversion material layer and a second conversion layer pixel layer, the second conversion layer on a side of the single substrate layer opposite the first side of the single substrate layer;

a printed circuit board for receiving signals generated by the first or second conversion layers, wherein the single substrate layer is the printed circuit board;

a set of readout electronics, the read out electronics integrated within the printed circuit board; and

a processor for processing the signals to produce an image being generated;

wherein the first conversion layer pixel layer and the second conversion layer pixel layer each include in-pixel transistors embedded within and share the set of readout electronics.

2. The multi-layer flat panel detector of claim 1 wherein the first conversion layer absorbs a low-energy spectrum and the second conversion layer absorbs a high-energy spectrum.

3. The multi-layer flat panel detector of claim 1 wherein the first conversion layer absorbs a high-energy spectrum and the second conversion layer absorbs a low-energy spectrum.

4. The multi-layer flat panel detector of claim 1 further comprising a collimator for collimating x-ray photons which are directed at the detector.

5. The multi-layer flat panel detector of claim 4 wherein the x-ray photons are collimated to be perpendicular to the first conversion layer.

6. The multi-layer flat panel detector of claim 1 wherein the first conversion layer further comprises:

a first conversion layer top electrode layer; and

a first conversion layer encapsulation layer.

7. The multi-layer flat panel detector of claim 6 wherein the first conversion layer top electrode layer is a transparent top electrode layer.

8. The multi-layer flat panel detector of claim 1 wherein the single substrate layer is a glass substrate layer.

9. The multi-layer flat panel detector of claim 1 wherein the first and second conversion layers are direct conversion layers.

10. The multi-layer flat panel detector of claim 1 wherein the first and second conversion layers are indirect conversion layers.

11. The multi-layer flat panel detector of claim 1 wherein the first conversion layer is a direct conversion layer and the second conversion layer is an indirect conversion layer.

12. The multi-layer flat panel detector of claim 1 wherein the first conversion layer is an indirect conversion layer and the second conversion layer is a direct conversion layer.

18. The multi-layer flat panel detector of claim 1 wherein the in-pixel transistors form a passive pixel sensor or an active pixel sensor.

19. The multi-layer flat panel detector of claim 1 wherein the first and second conversion layers are deposited directly onto the single substrate layer.

13. A mammography unit comprising:

a x-ray source;

a multi-layer flat panel detector; and

a compression panel;

wherein the multi-layer flat panel detector includes;

a single substrate layer;

a first conversion layer configured to detect radiation from the x-ray source including a first conversion layer conversion material layer and a first conversion layer pixel layer, the first conversion layer on a first side of the single substrate layer;

a second conversion layer configured to detect radiation from the x-ray source including a second conversion layer conversion material layer and a second conversion layer pixel layer, the second conversion layer on a side of the single substrate layer opposite the first side of the single substrate layer;

a printed circuit board for receiving signals generated by the first or second conversion layers, wherein the single substrate layer is the printed circuit board;

a set of readout electronics, the read out electronics integrated within the printed circuit board; and

a processor for processing the signals to produce an image being generated;

wherein the first conversion layer pixel layer and the second conversion layer pixel layer each include in-pixel transistors embedded within and share the set of readout electronics.

14. The mammography unit of claim 13 wherein the first and second conversion layers are direct conversion layers.

15. The mammography unit of claim 13 wherein the first and second conversion layers are indirect conversion layers.

16. The mammography unit of claim 13 wherein the first conversion layer is a direct conversion layer and the second conversion layer is an indirect conversion layer.

17. The mammography unit of claim 13 wherein the first conversion layer is an indirect conversion layer and the second conversion layer is a direct conversion layer.