High speed metrology with numerically controlled machines

• US 9,528,826 B2
• Filed: 11/04/2015
• Issued: 12/27/2016
• Est. Priority Date: 12/08/2012
• Status: Active Grant

• Current Assignee: Grale Technologies, Inc.
• Original Assignee: Grale Technologies, Inc.
• Inventors: Garvey, Michael, Osterloh, James D., Persi, Fred
• Primary Examiner(s): GUADALUPE, YARITZA
• Application Number:
  US14/932,036
• Publication Number:
  US 20160069677A1
• Time in Patent Office: 419 Days
• Field of Search: 335/03
• US Class Current: 1/1
• CPC Class Codes: G01B 21/04 by measuring coordinates of points
• CPC Class Codes: G01B 21/16 for measuring distance of clearance between spaced objects
• CPC Class Codes: G05B 19/401 characterised by control arrangements for measuring, e.g. calibration and initialisation, measuring workpiece for machining purposes G05B19/19 takes precedence
• CPC Class Codes: G05B 2219/37198 Machine as measuring station, use tool or probe, in process incycle
• CPC Class Codes: Y02P 80/40 Minimising material used in manufacturing processes

Abstract

Systems, apparatuses and methods are described for integrating an electronic metrology sensor with precision production equipment such as computer numerically controlled (CNC) machines. For example, a laser distance measuring sensor is used. Measurements are taken at a relatively high sample rate and converted into a format compatible with other data generated or accepted by the CNC machine. Measurements from the sensor are synchronized with the position of the arm of the machine such as through the use of offsets. Processing yields a detailed and highly accurate three-dimensional map of a workpiece in the machine. Applicable metrology instruments include other near continuously reading non-destructive characterization instruments such as contact and non-contact dimensional, eddy current, ultra-sound, and X-Ray Fluorescence (XRF) sensors.

Claims

1. A system, comprising:

a metrology device configured to measure workpiece metrology values;

a manufacturing machine comprising an operating tool arm fixed to the metrology device and a workpiece at least partially inside the working envelope of the manufacturing machine, configured to measure and record its position coordinate values and an index signal value at a regular or near regular first frequency;

a computer component configured to generate an index signal that increments periodically at a regular or near regular second frequency;

a computer component configured to simultaneously record the workpiece metrology values and the corresponding index signal values creating a matrix of metrology values and raw index values;

a computer component configured to temporally adjust the index values and create a matrix of workpiece metrology values and temporally adjusted index values;

a computer component configured to transmit the index signal to the manufacturing machine in a format compatible with the manufacturing machine;

a computer component configured to interpolate the manufacturing machine position coordinate values corresponding with the matrix of temporally adjusted index values;

a computer component configured to apply a vector addition of interpolated machine position coordinate values and corresponding workpiece metrology values creating a spatially oriented workpiece metrology value matrix; and

a computer component configured to visualize, summarize, and/or report the resulting spatially oriented workpiece metrology value matrix.

2. The system of claim 1, wherein at least one of the metrology device or a computing component is configured to filter the workpiece metrology values according to a filtering criterion.

3. The system of claim 1, wherein the temporal adjustment is constant.

4. The system of claim 1, wherein the at least one of the metrology device or a computing device is configured to vary a rate of measurement and/or recording of the metrology values during the cycle of movement based on a measured characteristic of the workpiece.

5. The system of claim 1, wherein the metrology device comprises one of a surface flaw detector, a through-body inspection device, an x-ray fluorescence (XRF) analyzer, a non-contact distance measurement device, or a contact distance measurement device.

6. The system of claim 1, wherein the manufacturing machine comprises one of a computer numerically controlled (CNC) machine or a robot.

7. A method for determining a property of a workpiece in a coordinate machine, comprising:

measuring, by a measuring device attached to a machine tool arm of the coordinate machine, a property value associated with a spatial point of a workpiece as the machine tool arm performs a movement sequence along a programmed path;

encoding the property value to yield an encoded value comprising a format acceptable by a recording component of the coordinate machine;

matching the encoded value to a coordinate value for the machine tool arm during the movement sequence; and

recording the encoded value in association with the coordinate value.

8. The method of claim 7, wherein the matching comprises at least one of applying a temporal delay value to the coordinate value and comprises measuring an impedance value as the property value.

9. The method of claim 8, further comprising:

matching a plurality of encoded values, including the encoded value, to a plurality of coordinate values to yield synchronized data;

determining a map of impedance values for the workpiece based on the synchronized data; and

generating a graphical representation of the workpiece based on the map of impedance values.

10. The method of claim 9, wherein the generating the graphical representation comprises illustrating at least one of a high impedance line or a zone of the workpiece indicative of a surface flaw, a near surface flaw, or a discontinuity.

11. The method of claim 7, further comprising:

matching a plurality of encoded values, including the encoded value, to a plurality of coordinate values to yield synchronized data; and

generating a graphical representation of the workpiece based on the synchronized data.

12. A method for determine a workpiece property, comprising:

measuring, with a measuring device attached to a machine tool arm of a coordinate machine, a value associated with a point of the workpiece as the machine tool arm traverses a programmed path;

generating a modulated indexing signal that increments at a defined frequency;

matching the value associated with the point of the workpiece with a first value of the modulated indexing signal correspond to a time of the measuring;

interpolating a coordinate value for the machine tool arm corresponding with the first value of the modulated indexing signal corresponding to a time of the measuring; and

recording the interpolated coordinate value for the machine tool arm with the corresponding workpiece property value.

13. The method of claim 12, further comprising:

measuring a set of distance values, including the distance value, using an ultrasound measuring device; and

matching the set of distance values with a corresponding set of coordinate values recorded for the machine tool arm during traversal of the machine tool arm along the programmed path, wherein the matching is based on the modulated indexing signal.

14. The method of claim 13, further comprising:

determining a set of dimensional coordinates for the workpiece based on the set of distance values and the set of coordinate values; and

generating a graphical representation of the workpiece based on the set of dimensional coordinates, wherein the graphical representation illustrates at least one of an internal reflecting body of the workpiece or a surface characteristic of the workpiece.

15. The method of claim 12, wherein the measuring comprises measuring a value associated with an alloy make-up table using an X-ray device.

16. The method of claim 15, further comprising:

determining a set of alloy compliant zones and non-compliant zones for the workpiece based on the value associated with the alloy make-up table, the encoded index value, the coordinate value, and a zoned alloy make-up specification; and

generating a graphical representation of the workpiece based on the set of alloy compliant zones and non-compliant zones.

17. The method of claim 12, further comprising applying a time offset to at least one of the encoded index value, the coordinate value, or the value associated with the point of the workpiece to yield synchronized data.

18. A method for spatial correction of metrology data, comprising:

recording metrology data values substantially synchronously with spatial coordinate values for a production device as the production device traverses a programmed path;

computing an instantaneous scan vector based at least in part on the spatial coordinate values; and

assigning a metrology data value, of the metrology data values, to a spatial location based on the instantaneous scan vector.

19. The method of claim 18, wherein the metrology data value is recorded substantially synchronously with a first of the spatial coordinate values, and wherein the assigning comprises assigning the metrology data value to a spatial location corresponding to a second of the spatial coordinate values immediately prior to the first of the spatial coordinate values plus a fraction of the instantaneous scan vector.

20. The method of claim 19, wherein the fraction comprises one minus a shift ratio determined for a metrology instrument that measures the metrology data values, wherein the shift ratio comprises a temporal delay of the metrology instrument divided by a temporal logging interval of the production device.