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Method and apparatus for measuring oxidation-reduction potential

  • US 9,528,959 B2
  • Filed: 04/13/2015
  • Issued: 12/27/2016
  • Est. Priority Date: 02/28/2011
  • Status: Active Grant
First Claim
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1. An oxidation-reduction potential test device, comprising:

  • a substrate;

    a sample chamber;

    a first test lead, the first test lead including;

    a first area extending into the sample chamber;

    a second area extending from the sample chamber;

    a second test lead, the second test lead including;

    a first area extending into the sample chamber;

    a second area extending from the sample chamber;

    a reference cell;

    a reference lead, including;

    a first area in electrical contact with the reference cell;

    a second area extending from the reference cell;

    a filter, wherein the filter extends from at least a portion of the sample chamber to an area adjacent the reference cell;

    an overlay, wherein at least a portion of each of the first test lead, the second test lead, the reference cell, the reference lead, and the filter are located between the substrate and the overlay when the overlay is interconnected to the substrate, wherein the overlay includes an aperture, and wherein the aperture corresponds to at least a portion of the sample chamber when the overlay is interconnected to the substrate; and

    a dielectric layer, wherein the dielectric layer is located between the overlay and the substrate, wherein at least portions of the first and second test leads are located between the dielectric layer and the substrate, wherein the dielectric layer includes a first aperture that overlaps with at least a portion of the aperture of the overlay, and wherein the dielectric layer includes a second aperture adjacent the reference cell.

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