Systems and methods for test time outlier detection and correction in integrated circuit testing
First Claim
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1. A method of semiconductor testing comprising:
- while a test program is being applied to a semiconductor device, recognizing said semiconductor device as a candidate for test aborting because said device is testing too slowly based on data relating to a plurality of tests in said test program;
deciding whether to abort testing on said candidate; and
preventing said candidate from completing said test program, if said decision is to abort;
wherein after said device has completed said test program or has been prevented from completing said test program and if there is at least one remaining untested semiconductor device, said test program is applied to at least one of said remaining untested semiconductor devices.
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Abstract
Methods and systems for semiconductor testing are disclosed. In one embodiment, devices which are testing too slowly are prevented from completing testing, thereby allowing untested devices to begin testing sooner.
36 Citations
18 Claims
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1. A method of semiconductor testing comprising:
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while a test program is being applied to a semiconductor device, recognizing said semiconductor device as a candidate for test aborting because said device is testing too slowly based on data relating to a plurality of tests in said test program; deciding whether to abort testing on said candidate; and preventing said candidate from completing said test program, if said decision is to abort; wherein after said device has completed said test program or has been prevented from completing said test program and if there is at least one remaining untested semiconductor device, said test program is applied to at least one of said remaining untested semiconductor devices. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17)
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18. A non-transitory computer program product comprising a non-transitory computer useable medium having computer readable program code embodied therein for semiconductor testing, the computer program product comprising:
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computer readable program code for causing a computer while a test program is being applied to a semiconductor device, to recognize said semiconductor device as a candidate for test aborting because said device is testing too slowly based on data relating to a plurality of tests in said test program; computer readable program code for causing the computer to decide whether to abort testing on said candidate; and computer readable program code for causing the computer to prevent said candidate from completing said test program, if said decision is to abort; wherein after said device has completed said test program or has been prevented from completing said test program and if there is at least one remaining untested semiconductor device, said test program is applied to at least one of said remaining untested semiconductor devices.
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Specification