Electrical fuse with metal line migration
First Claim
1. A method for programming an electrical fuse device comprising:
- coupling a cathode element comprising tungsten to a contact that is connected to a metal line comprised of copper;
coupling an anode element comprising tungsten to the metal line; and
activating the anode and cathode elements to apply a programming current ranging from 4 mA to 7 mA through the contact and the metal line such that the metal line electromigrates away from the contact forming an electromigration opening portion of the electrical fuse present in the metal line underlying one of the cathode element and the anode element, wherein each of said cathode element and said anode element have a height ranging from 30 nm to 80 nm.
1 Assignment
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Accused Products
Abstract
An electrical fuse device is disclosed. A circuit apparatus can include the fuse device, a first circuit element and a second circuit element. The fuse includes a first contact that has a first electromigration resistance, a second contact that has a second electromigration resistance and a metal line, which is coupled to the first contact and to the second contact, that has a third electromigration resistance that is lower than the second electromigration resistance. The first circuit element is coupled to the first contact and the second circuit element coupled to the second contact. The fuse is configured to conduct a programming current from the first contact to the second contact through the metal line. Further, the programming current causes the metal line to electromigrate away from the second contact to electrically isolate the second circuit element from the first circuit element.
22 Citations
6 Claims
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1. A method for programming an electrical fuse device comprising:
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coupling a cathode element comprising tungsten to a contact that is connected to a metal line comprised of copper; coupling an anode element comprising tungsten to the metal line; and activating the anode and cathode elements to apply a programming current ranging from 4 mA to 7 mA through the contact and the metal line such that the metal line electromigrates away from the contact forming an electromigration opening portion of the electrical fuse present in the metal line underlying one of the cathode element and the anode element, wherein each of said cathode element and said anode element have a height ranging from 30 nm to 80 nm. - View Dependent Claims (2, 3, 4, 5, 6)
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Specification