Method and apparatus for sorting particles
First Claim
1. A particle detecting system comprising:
- a first flow path having a detection region adapted to facilitate analysis or processing of a sample having one or more particles flowing through the first flow path of the detection region;
a first optically detectable pattern associated with the detection region, the first optically detectable pattern positioned to receive a particle optical signal associated with a particle flowing through the first flow path of the detection region and to produce a patterned optical signal; and
a first detector positioned to receive the patterned optical signal,wherein the first detector is configured to analyze the patterned optical signal to independently determine both;
(i) a particle characteristic based on a property of the particle optical signal associated with the particle flowing through the detection region; and
(ii) a particle parameter based on a property of the first optically detectable pattern.
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Abstract
A method and a system are provided for detecting particles moving through a detection region or regions for facilitating or processing a sample having one or more particles flowing through the detection region. The particle detection system may include an optically detectable pattern associated with a detection region. The optically detectable pattern may be configured to receive a particle optical signal and produce a patterned optical signal. The detection system may further include a detector configured to analyze the patterned optical signal to determine both a particle characteristic based on a property of the particle optical signal and a particle parameter based on a property of the optically detectable pattern.
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Citations
28 Claims
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1. A particle detecting system comprising:
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a first flow path having a detection region adapted to facilitate analysis or processing of a sample having one or more particles flowing through the first flow path of the detection region; a first optically detectable pattern associated with the detection region, the first optically detectable pattern positioned to receive a particle optical signal associated with a particle flowing through the first flow path of the detection region and to produce a patterned optical signal; and a first detector positioned to receive the patterned optical signal, wherein the first detector is configured to analyze the patterned optical signal to independently determine both; (i) a particle characteristic based on a property of the particle optical signal associated with the particle flowing through the detection region; and (ii) a particle parameter based on a property of the first optically detectable pattern. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19, 20, 21, 22, 23, 24, 25, 26, 27, 28)
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Specification