Nonvolatile memory device having variable resistance memory cells and a method of resetting by initially performing pre-read or strong set operation
First Claim
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1. A method of programming a variable resistance memory cell in a nonvolatile memory device, the method comprising:
- programming the variable resistance memory cell to one of a plurality of set states using a corresponding one of a plurality of compliance currents;
pre-reading the variable resistance memory cell to determine the resistance of the variable resistance memory cell; and
programming the variable resistance memory cell to a reset state using a variable reset voltage based on the determined resistance of the variable resistance memory cell, whereinthe variable reset voltage is one of a plurality of reset voltages respectively corresponding to the plurality of set states.
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Abstract
A method of resetting a variable resistance memory cell in a nonvolatile memory device includes; programming the memory cell to a set state using a corresponding compliance current, and then programming the memory cell to a reset state by pre-reading the variable resistance memory cell to determine its resistance and resetting the memory cell using a variable reset voltage determined in response to the determined resistance.
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Citations
19 Claims
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1. A method of programming a variable resistance memory cell in a nonvolatile memory device, the method comprising:
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programming the variable resistance memory cell to one of a plurality of set states using a corresponding one of a plurality of compliance currents; pre-reading the variable resistance memory cell to determine the resistance of the variable resistance memory cell; and programming the variable resistance memory cell to a reset state using a variable reset voltage based on the determined resistance of the variable resistance memory cell, wherein the variable reset voltage is one of a plurality of reset voltages respectively corresponding to the plurality of set states. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8)
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9. A method of programming a variable resistance memory cell in a nonvolatile memory device, the method comprising:
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programming the variable resistance memory cell to one of a plurality of set states using a corresponding one of a plurality of compliance currents; programming the variable resistance memory cell to a strong set state using a variable voltage based on a resistance of the variable resistance memory cell; and programming the variable resistance memory cell to a reset state from the strong set state using a constant reset voltage. - View Dependent Claims (10, 11)
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12. A method of programming a variable resistance memory cell in a nonvolatile memory device, the method comprising:
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programming the variable resistance memory cell to one of a plurality of set states using a corresponding one of a plurality of compliance currents; pre-reading the variable resistance memory cell to determine the resistance of the variable resistance memory cell; programming the variable resistance memory cell to a strong set state using a variable voltage based on the determined resistance of the variable resistance memory cell; and programming the variable resistance memory cell to a reset state from the strong set state using a constant reset voltage. - View Dependent Claims (13, 14, 15, 16, 17, 18, 19)
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Specification