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Capacitance detecting method, integrated circuit, touch sensor system, and electronic device

  • US 9,563,323 B1
  • Filed: 10/04/2016
  • Issued: 02/07/2017
  • Est. Priority Date: 11/12/2010
  • Status: Active Grant
First Claim
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1. A capacitance detecting method, comprising the steps of:

  • (A) (a) driving, on a basis of code sequences di (=di1, di2, . . . , diN, where i=1, . . . , and where M<

    N) each of which has a length N, M drive lines in parallel for each of (I) a first capacitance column Ci1 (i=1, . . . , M) formed between the M drive lines and a first sense line and (II) a second capacitance column Ci2 (i=1, . . . , M) formed between the M drive lines and a second sense line, and thus (b) outputting, to an analog integrator, outputs sFirst=(s11, s12, . . . , s1N) from the first capacitance column and outputs sSecond=(s21, s22, . . . , s2N) from the second capacitance column; and

    (B) estimating (a) on a basis of a first inner product operation of the outputs sFirst and the code sequences di, a first capacitance value in the first capacitance column which first capacitance value corresponds to a k1-th drive line and (b) on a basis of a second inner product operation of the outputs sSecond and the code sequences di, a second capacitance value in the second capacitance column which second capacitance value corresponds to a k2-th drive line,the step (A) driving, when the analog integrator is reset, the M drive lines at a first voltage represented by a voltage Vref and driving, when the outputs sFirst and sSecond from the first and second capacitance columns are sampled, the M drive lines at (i) a second voltage for an element of +1 in the code sequences, the second voltage being represented by a voltage (Vref+V), and (ii) a third voltage for an element of −

    1 in the code sequences, the third voltage being represented by a voltage (Vref−

    V).

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