Component part and method for testing such a component part

• US 9,588,005 B2
• Filed: 08/27/2013
• Issued: 03/07/2017
• Est. Priority Date: 08/28/2012
• Status: Active Grant

• Current Assignee: Robert Bosch GmbH
• Original Assignee: Robert Bosch GmbH
• Inventors: Zoellin, Jochen, Ehrenpfordt, Ricardo, Graf, Juergen, Schelling, Christoph, Ante, Frederik, Curcic, Michael
• Primary Examiner(s): Lyons, Michael A
• Assistant Examiner(s): Mercado, Alexander
• Application Number:
  US14/011,684
• Publication Number:
  US 20140060146A1
• Time in Patent Office: 1,288 Days
• Field of Search: 73/11.5, 738/624.73
• US Class Current: 1/1
• CPC Class Codes: G01L 25/00 Testing or calibrating of apparatus for measuring force, torque, work, mechanical power, or mechanical efficiency
• CPC Class Codes: G01L 27/005 Apparatus for calibrating pressure sensors
• CPC Class Codes: H01L 2224/48091 Arched
• CPC Class Codes: H01L 2224/48137 the bodies being arranged next to each other, e.g. on a common substrate
• CPC Class Codes: H01L 2924/00014 the subject-matter covered by the group, the symbol of which is combined with the symbol of this group, being disclosed without further technical details
• CPC Class Codes: H01L 2924/16151 Cap comprising an aperture, e.g. for pressure control, encapsulation
• CPC Class Codes: H01L 2924/16152 Cap comprising a cavity for hosting the device, e.g. U-shaped cap
• CPC Class Codes: H04R 2201/003 Mems transducers or their use of the electrostatic type H04R19/005
• CPC Class Codes: H04R 29/004 for microphones H04R29/007 takes precedence

Abstract

Measures are described which simplify the functional testing of a component having an MEMS element provided with a pressure-sensitive sensor diaphragm, and which allow a self-calibration of the component even after it is already in place, i.e., following the end of the production process. The component has a housing, in which are situated at least one MEMS element having a pressure-sensitive sensor diaphragm and a switching arrangement for detecting the diaphragm deflections as measuring signals; an arrangement for analyzing the measuring signals; and an arrangement for the defined excitation of the sensor diaphragm. The housing has at least one pressure connection port. The arrangement for exciting the sensor diaphragm includes at least one selectively actuable actuator component for generating defined pressure pulses that act on the sensor diaphragm.

Claims

1. A component, comprising:

a housing in which are situated at least;

an MEMS element having a pressure-sensitive sensor diaphragm and a switching arrangement for detecting a diaphragm deflection as a measuring signal,

an arrangement for analyzing the measuring signal,

an arrangement for providing a defined excitation of the sensor diaphragm, and

at least one pressure connection port, wherein the arrangement for exciting the sensor diaphragm includes at least one selectively actuable actuator component for generating defined pressure pulses that act on the sensor diaphragm, and wherein;

the at least one pressure connection port is a through hole in the housing,

the actuator component is at least partially integrated into a component structure of the MEMS element;

the actuator component includes at least;

an actuator diaphragm formed on a side next to the sensor diaphragm, and

a switching arrangement for deflecting the actuator diaphragm independently of the sensor diaphragm, wherein the actuator diaphragm is provided with at least one electrode of a selectively actuable actuator capacitor;

at least one stationary counter element is developed at least one of above and below the actuator diaphragm in the component structure of the MEMS element; and

the counter element is provided with at least one counter electrode of the actuator capacitor.

2. The component as recited in claim 1, wherein the actuator diaphragm is provided with selectively actuable piezo layers.

3. The component as recited in claim 1, wherein the actuator diaphragm is a ring situated concentrically to the sensor diaphragm.

4. The component as recited in claim 1, wherein the actuator component is realized independently of the first MEMS element having the sensor diaphragm, in a further structural element.

5. The component as recited in claim 4, wherein the further structural element includes a further MEMS element.

6. The component as recited in claim 1, wherein the component is included in a pressure sensor component.

7. The component as recited in claim 1, wherein the component is included in a microphone element.

8. A method for testing a component having a housing, in which are situated at least one pressure connection port, at least an MEMS element having a pressure-sensitive sensor diaphragm and a switching arrangement for detecting a diaphragm deflection, and an arrangement for analyzing the diaphragm deflection, the method comprising:

generating at least one defined pressure pulse inside the housing with the aid of an actuator component;

detecting and analyzing deflections of the sensor diaphragm induced by the defined pressure pulse inside the housing with the aid of the arrangement for analyzing the diaphragm deflection; and

wherein;

the at least one pressure connection port is a through hole in the housing;

the actuator component is at least partially integrated into a component structure of the MEMS element;

the actuator component includes at least;

an actuator diaphragm formed on a side next to the sensor diaphragm, and

a switching arrangement for deflecting the actuator diaphragm independently of the sensor diaphragm, wherein the actuator diaphragm is provided with at least one electrode of a selectively actuable actuator capacitor;

at least one stationary counter element is developed at least one of above and below the actuator diaphragm in the component structure of the MEMS element; and

the counter element is provided with at least one counter electrode of the actuator capacitor.

9. The method as recited in claim 8, wherein the method is for calibrating the component.

10. The method as recited in claim 8, further comprising:

adapting an electrical sensor parameter of the component as a function of a result of the analysis.

11. The method as recited in claim 10, wherein the electrical sensor parameter includes one of a polarization voltage and a mechanical prestressing of the sensor diaphragm.

12. The method as recited in claim 8, wherein the component is declared a good part or a defective part as a function of a result of the analysis.