×

Stun device testing apparatus and methods

  • US 9,588,165 B2
  • Filed: 09/25/2013
  • Issued: 03/07/2017
  • Est. Priority Date: 09/23/2008
  • Status: Expired due to Fees
First Claim
Patent Images

1. A tester for testing an electric discharge stun device, the tester comprising:

  • a housing;

    a circuit disposed within the housing for receiving a discharge from a stun device;

    a contact connected to the circuit, wherein the contact is adapted to connect to a discharge element of the stun device; and

    a processor connected to the circuit, wherein the processor is adapted to compare automatically a test discharge characteristic to a known characteristic.

View all claims
  • 0 Assignments
Timeline View
Assignment View
    ×
    ×