Information matrix creation and calibration test pattern selection based on computational lithography model parameters
First Claim
1. A method of selecting a subset of test patterns from an initial set of test patterns, the initial set of test patterns having a larger number of test patterns than the number of test patterns in the subset, the method comprising:
- generating an information matrix for the initial set of test patterns, wherein the information matrix comprises an input value for each of a plurality of parameters for variable terms of a computational lithography model that models at least part of a process involving lithography, the input values determined for each of the test patterns in the initial set of test patterns; and
selecting, by a computer hardware system and based on the information matrix input values of the plurality of parameters determined for each of the initial set of test patterns, the subset of test patterns for calibrating the computational lithography model.
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Abstract
Embodiments of the present invention describe methods of selecting a subset of test patterns from an initial larger set of test patterns for calibrating a computational lithography model. An example method comprises: generating an information matrix for the initial larger set of test patterns, wherein the terms of the information matrix comprise one or more identified model parameters that represent a lithographic process response; and, executing a selection algorithm using terms of the information matrix to select the subset of test patterns that effectively determines values of the identified model parameters that contribute significantly in the lithographic process response, wherein the subset of test patterns characteristically represents the initial larger set of test patterns. The selection algorithm explores coverage relationships existing in the initial larger set of test patterns.
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24 Claims
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1. A method of selecting a subset of test patterns from an initial set of test patterns, the initial set of test patterns having a larger number of test patterns than the number of test patterns in the subset, the method comprising:
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generating an information matrix for the initial set of test patterns, wherein the information matrix comprises an input value for each of a plurality of parameters for variable terms of a computational lithography model that models at least part of a process involving lithography, the input values determined for each of the test patterns in the initial set of test patterns; and selecting, by a computer hardware system and based on the information matrix input values of the plurality of parameters determined for each of the initial set of test patterns, the subset of test patterns for calibrating the computational lithography model. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19, 20, 21, 22, 23, 24)
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Specification