Defect classification using topographical attributes
First Claim
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1. A method for classification, comprising:
- receiving, by a processing device, a three-dimensional (3D) map of an area of a semiconductor wafer containing a location of interest;
generating a 3D shape corresponding to the location of interest based on a fitting of the 3D shape using a polynomial equation to the location of interest, and wherein the 3D shape that is fitted using the polynomial equation expresses a plane component that is used to measure a slope of a topographical surface of the 3D shape in a first direction and another slope of the topographical surface of the 3D shape in a second direction;
computing, by the processing device, a value for an attribute of the location of interest based on the topographical surface of the 3D shape that is fitted to the location of interest; and
classifying a defect corresponding to the location of interest on the semiconductor wafer based on the value that is computed based on the topographical surface of the 3D shape that is fitted to the location of interest.
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Abstract
A method for classification includes receiving an image of an area of a semiconductor wafer on which a pattern has been formed, the area containing a location of interest. At least one value for one or more attributes of the location of interest are computed based upon topographical features of the location of interest in a three-dimensional (3D) map of the area.
78 Citations
26 Claims
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1. A method for classification, comprising:
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receiving, by a processing device, a three-dimensional (3D) map of an area of a semiconductor wafer containing a location of interest; generating a 3D shape corresponding to the location of interest based on a fitting of the 3D shape using a polynomial equation to the location of interest, and wherein the 3D shape that is fitted using the polynomial equation expresses a plane component that is used to measure a slope of a topographical surface of the 3D shape in a first direction and another slope of the topographical surface of the 3D shape in a second direction; computing, by the processing device, a value for an attribute of the location of interest based on the topographical surface of the 3D shape that is fitted to the location of interest; and classifying a defect corresponding to the location of interest on the semiconductor wafer based on the value that is computed based on the topographical surface of the 3D shape that is fitted to the location of interest. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11)
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12. An apparatus comprising:
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a memory; and a processor coupled with the memory, wherein the processor is to; receive a three-dimensional (3D) map of an area of a semiconductor wafer containing a location of interest; generate a 3D shape corresponding to the location of interest based on a fitting of the 3D shape using a polynomial equation to the location of interest, and wherein the 3D shape that is fitted using the polynomial equation expresses a plane component that is used to measure a slope of a topographical surface of the 3D shape in a first direction and another slope of the topographical surface of the 3D shape in a second direction; compute a value for an attribute of the location of interest based on a topographical surface of the 3D shape that is fitted to the location of interest; and classify a defect corresponding to the location of interest on the semiconductor wafer based on the value that is computed based on the topographical surface of the 3D shape that is fitted to the location of interest. - View Dependent Claims (13, 14, 15, 16, 17, 18, 19, 20, 21, 22)
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23. A non-transitory computer readable storage medium having instructions that, when executed by a processing device, cause the processing device to perform operations comprising:
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receiving a three-dimensional (3D) map of an area of a semiconductor wafer containing a location of interest; generating a 3D shape corresponding to the location of interest based on a fitting of the 3D shape using a polynomial equation to the location of interest, and wherein the 3D shape that is fitted using the polynomial equation expresses a plane component that is used to measure a slope of a topographical surface of the 3D shape in a first direction and another slope of the topographical surface of the 3D shape in a second direction; computing a value for an attribute of the location of interest based on a surface of the 3D shape that is fitted to the location of interest; and classifying a defect corresponding to the location of interest on the semiconductor wafer based on the value that is computed based on the surface of the 3D shape that is fitted to the location of interest. - View Dependent Claims (24, 25, 26)
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Specification