Motion analysis apparatus and motion analysis method

• US 9,599,635 B2
• Filed: 02/10/2014
• Issued: 03/21/2017
• Est. Priority Date: 02/14/2013
• Status: Active Grant

• Current Assignee: Seiko Epson Corporation (Seiko Group)
• Original Assignee: Seiko Epson Corporation (Seiko Group)
• Inventors: Nomura, Kazuo
• Primary Examiner(s): TSAI, CAROL S W
• Application Number:
  US14/176,468
• Publication Number:
  US 20140229135A1
• Time in Patent Office: 1,135 Days
• Field of Search: 702/87, 702/94, 702/142, 702/151, 702/85, 702/145, 702/155
• US Class Current: 1/1
• CPC Class Codes: G01C 25/005 initial alignment, calibration or starting-up of inertial devices
• CPC Class Codes: G01P 21/00 Testing or calibrating of apparatus or devices covered by the preceding groups

Abstract

A motion analysis apparatus includes: a threshold value determining section that determines whether the amount of inertia in a first period is within a threshold value range; a bias value setting section that sets, if it is determined that the amount of inertia is within the threshold value range, a bias value included in the amount of inertia on the basis of a first average value that is an average value of the amount of inertia detected in the first period; and an analysis information calculating section that analyzes a motion of a measurement object using correction data from which the bias value is removed.

Claims

1. A motion analysis apparatus that is configured to execute processes by a processor, the motion analysis apparatus comprising:

the processor configured to provide;

a threshold value determining section that determines whether the amount of inertia detected by an inertial sensor in a first period is within a threshold value range;

a bias value setting section that sets, if it is determined that the amount of inertia is within the threshold value range, a bias value included in the amount of inertia on the basis of a first average value that is an average value of the amount of inertia detected in the first period; and

an analysis information calculating section that analyzes a motion of a measurement object using correction data from which the bias value is removed,

wherein the threshold value determining section sets the threshold value with reference to a second average value that is an average value of the amount of inertia which is a detection result of the inertial sensor in the entire period, and

when there is a plurality of the first periods in which the amount of inertia is determined to be within the threshold value range, the bias value setting section sets the bias value on the basis of the first average value in the first period in which a difference between the second average value and the amount of inertia is the smallest.

2. The motion analysis apparatus according to claim 1,

wherein at least one of the first period and the threshold value is specified based on the type of a motion of the measurement object.

3. The motion analysis apparatus according to claim 1,

wherein at least one of the first period and the threshold value is specified on the basis of a position to which the inertial sensor is attached.

4. The motion analysis apparatus according to claim 1,

wherein at least one of the first period and the threshold value is set on the basis of a frequency component of a detection result of the inertial sensor.

5. A motion analysis method for causing a processor to execute a process, the motion analysis method comprising executing on the processor the steps of:

determining whether the amount of inertia detected by an inertial sensor in a first period is within a threshold value range;

setting a bias value, if it is determined that the amount of inertia detected in the first period is within the threshold value range, included in the amount of inertial on the basis of a first average value that is an average value of the amount of inertia detected in the first period; and

analyzing a motion of a measurement object using correction data from which the bias value is removed,

wherein the determining step determines whether a variance value of the amount of inertia detected in the first period is within the threshold value range, and

when there is a plurality of the first periods in which the variance value is determined to be within the threshold value range, the setting step sets the bias value on the basis of the first average value in the first period in which the maximum variance value of the amount of inertia is the smallest.

6. A motion analysis apparatus that is configured to execute processes by a processor, the motion analysis apparatus comprising:

the processor configured to provide;

a threshold value determining section that determines whether the amount of inertia detected by an inertial sensor in a first period is within a threshold value range;

a bias value setting section that sets, if it is determined that the amount of inertia is within the threshold value range, a bias value included in the amount of inertia on the basis of a first average value that is an average value of the amount of inertia detected in the first period; and

an analysis information calculating section that analyzes a motion of a measurement object using correction data from which the bias value is removed,

wherein the threshold value determining section determines whether a variance value of the amount of inertia detected in the first period is within the threshold value range, and

when there is a plurality of the first periods in which the variance value is determined to be within the threshold value range, the bias value setting section sets the bias value on the basis of the first average value in the first period in which the maximum variance value of the amount of inertia is the smallest.