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Tuning-fork based near field probe for spectral measurement, near-field microscope using the same, and spectral analysis method using near-field microscope

  • US 9,606,052 B2
  • Filed: 07/24/2014
  • Issued: 03/28/2017
  • Est. Priority Date: 07/29/2013
  • Status: Active Grant
First Claim
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1. A tuning-fork based near-field probe for spectral measurement, comprising:

  • a first electrode and a second electrode arranged apart from each other; and

    a wire-shaped nano-probe downward attached to a one-side end of the second electrode and configured to vibrate in a perpendicular direction with respect to a sample,wherein the nano-probe comprises;

    a shaft for receiving a terahertz pulse incident through a means for focusing light;

    an end part for localizing the received terahertz pulse to interact with the sample, and scattering a terahertz pulse, into air, which has obtained local information of the sample in a localizing procedure; and

    a tapered region for connecting the shaft and the end part, wherein a length of the nano-probe, which is defined as a sum of a length of the shaft and a length of the tapered region is formed to be longer than a radius of a focus of a beam by the terahertz pulse which is focused by the means for focusing light.

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