Current measurement sensor and system

• US 9,612,262 B1
• Filed: 12/21/2012
• Issued: 04/04/2017
• Est. Priority Date: 12/21/2012
• Status: Active Grant

• Current Assignee: Neeme Systems Solutions Incorporated
• Original Assignee: Neeme Systems Solutions Incorporated
• Inventors: Nehmeh, Jody
• Primary Examiner(s): PATEL, PARESH H
• Application Number:
  US13/724,311
• Time in Patent Office: 1,565 Days
• Field of Search: None
• CPC Class Codes: G01R 15/202 using Hall-effect devices Hall elements in arrangements for measuring electrical power G01R21/08

Abstract

An electric current measuring device that employs a unique mechanical structure and Hall effect sensor array combined with processing of measurements obtained from the current measuring device to accurately measure current flow by cancelling the effects of static or dynamic magnetic noise originating from external sources. The process determines the actual current through the conductor by measuring and subtracting external noise.

Claims

1. A current measuring apparatus comprising:

a conductor mechanical structure formed in a planar U-shape such that an actual current to be measured enters into a first leg of the structure in a first direction, and exits the structure from a second leg in a second direction opposite to the first direction;

a first semiconductor Hall effect sensor, of a plurality of hall effect sensors, disposed at the first leg;

a second semiconductor Hall effect sensor, of the plurality of hall effect sensors, disposed at the second leg;

a third semiconductor Hall effect sensor, of the plurality of hall effect sensors, disposed at the first leg and side by side with the first Hall effect sensor;

a fourth semiconductor Hall effect sensor, of the plurality of hall effect sensors, disposed at the second leg and side by side with the second Hall effect sensor, and the first, second, third and fourth semiconductor Hall effect sensors are disposed in a line across the conductor mechanical structure; and

a logic device implementing a process to determine the actual current based on inputs from the plurality of Hall effect sensors coupled to the logic device.

2. The current measuring apparatus of claim 1, wherein the first leg and the second leg are disposed parallel to each other.

3. The current measuring apparatus of claim 1, wherein the conductor mechanical structure is formed in a “

U”

shape, such that current in a first leg of the “

U”

shape flows in the opposite direction of current in a second leg of the “

U”

shape.

4. The current measuring apparatus of claim 1, wherein the current conductor mechanical structure is a material selected from the group consisting of:

copper, aluminum, tantalum, silver, gold, or platinum.

5. The current measuring apparatus of claim 1, further including a temperature sensor wherein the output of at least one of the plurality of Hall effect current sensors is adjusted in accordance with temperature of the conductor mechanical structure to compensate for thermal variations.

6. The current measuring apparatus of claim 1, further comprising a controller coupled to outputs of the plurality of hall effect sensors, and outputting a current measured flowing in the conductor with the effects of external noise substantially removed from the measurement.

7. The current measuring apparatus of claim 6, further comprising programming inputs to the controller, via a bus output providing the current measured.

8. A current measuring contactor comprising:

a conductor mechanical structure formed in a generally planar U-shape such that an actual current to be measured enters into a first terminal of a first leg of the structure in a first direction, and exits the structure at an opposite end of the structure, from a first terminal of a second leg so that the current to be measured is directed in a second direction opposite to the first direction;

a first semiconductor Hall effect sensor, of a plurality of hall effect sensors, disposed at the first leg;

a second semiconductor Hall effect sensor, of the plurality of hall effect sensors, disposed at the second leg

a third semiconductor Hall effect sensor, of the plurality of hall effect sensors, disposed at the first leg and side by side with the first Hall effect sensor;

a fourth semiconductor Hall effect sensor, of the plurality of hall effect sensors, disposed at the second leg and side by side with the second Hall effect sensor, and the first, second, third and fourth semiconductor Hall effect sensors are disposed in a line across the conductor mechanical structure; and

a contactor having a contactor switch plate operatively coupled to a coil selectively operable to electrically couple the second terminal of the first leg to the second terminal of the second leg and interrupt a current flow as desired.

9. The current measuring contactor of claim 8, further comprising a logic device coupled to a coil controlling the contactor switch plate and causing the contactor switch plate to open or close based on external commands received from a discrete input or via two serial busses.

10. The current measuring contactor of claim 9, wherein the contactor switch plate is opened if the measured current indicates that an electric short has been detected based on integration of amperes squared times seconds over time or if the rated current of the contactor is exceeded for a predetermined interval.

11. The current measuring contactor of claim 9, wherein the command to open the contactor if an overcurrent condition is detected incorporates a variable time delay that is programmable based on the direction of the current flow.

12. The current measuring contactor of claim 9, wherein the logic device implements initialization, identification, BIT, and current measurement processes.