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Apparatus and method to monitor thermal runaway in a semiconductor device

  • US 9,618,560 B2
  • Filed: 07/01/2015
  • Issued: 04/11/2017
  • Est. Priority Date: 07/01/2015
  • Status: Active Grant
First Claim
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1. A semiconductor-based apparatus, comprising:

  • a semiconductor device;

    a current sensor configured to measure a first stand-by current and a second stand-by current of the semiconductor device;

    a temperature sensor configured to measure a first temperature and a second temperature of the semiconductor device; and

    a thermal runaway monitor, configured to;

    determine a ratio of a first difference relative to a second difference, the first difference being between the first stand-by current and the second stand-by current of the semiconductor device, and the second difference being between the first temperature and the second temperature of the semiconductor device; and

    determine whether a thermal runaway onset condition exists based on the ratio.

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