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Determining categories for memory fail conditions

  • US 9,620,244 B1
  • Filed: 05/10/2016
  • Issued: 04/11/2017
  • Est. Priority Date: 11/23/2015
  • Status: Active Grant
First Claim
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1. A computer-implemented method comprising:

  • checking one or more memory cells for a malfunction;

    creating a relational data structure comprising a plurality of interlinked nodes and a root node such that each test parameter configuration of a set of test parameter configurations for which a malfunction has been detected is represented by a path, wherein test parameters associated with the test parameter configurations are assigned to one or more nodes of the plurality of interlinked nodes of the path according to a defined order starting from the root node, wherein each path is assigned a detected bit fail count for the path'"'"'s respective test parameter configuration;

    combining one or more segments of the relational data structure according to a predefined rule for obtaining one or more test groups;

    creating a representation of the bit fail counts of the respective test groups;

    applying a filter to the relational data structure including the test groups in order to identify test parameter configurations categories to be further analyzed;

    storing, for each test parameter configurations for which a malfunction is detected, a bit fail map comprising information about a spatial distribution pattern of the malfunctioning memory cells; and

    determining a spatial distribution pattern of memory cells to be further analyzed using the parameter configuration categories to be further analyzed and the bit fail map.

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