Test element analysis system with contact surfaces coated with hard material

• US 9,638,655 B2
• Filed: 01/29/2014
• Issued: 05/02/2017
• Est. Priority Date: 03/10/2004
• Status: Active Grant

• Current Assignee: Roche Diagnostics Operations Incorporated (Roche Holding AG)
• Original Assignee: Roche Diagnostics Operations Incorporated (Roche Holding AG)
• Inventors: Augstein, Manfred, Dreibholz, Joerg, Riebel, Stefan
• Primary Examiner(s): Jarrett, Lore
• Application Number:
  US14/167,344
• Publication Number:
  US 20140147913A1
• Time in Patent Office: 1,189 Days
• CPC Class Codes: G01N 27/26 by investigating electrochemical variables; by using electrolysis or electrophoresis
• CPC Class Codes: G01N 33/4875 Details of handling test elements, e.g. dispensing or storage, not specific to a particular test method test-elements per se B01L, automatic analysers G01N35/00, in-vivo analysis on the human body for medical diagnosis A61B

Abstract

The invention concerns a test element analytical system for the analytical examination of a sample, especially a body fluid, comprising at least one test element with one or more measuring zones and contact areas located on the test element, in particular electrodes or conductor paths, the sample to be examined being brought into the measuring zone to carry out an analysis in order to determine a characteristic measured quantity for the analysis, and an evaluation instrument with a test element holder for positioning the test element in a measuring position and a measuring device for measuring the characteristic change, the test element holder containing contact elements with contact areas which enable an electrical contact between the contact areas of the test element and the contact areas of the test element holder, characterized in that one of these contact areas is provided with an electrically conductive hard material surface.

Claims

1. A test element analytical system for the analytical examination of a sample comprising:

a test element having at least one measuring zone and electrically conductive contact areas, the sample to be examined being brought into the measuring zone for the analytical examination, and

an evaluation instrument having a test element holder for positioning the test element containing the sample and a measuring device for measuring a change in the measuring zone that is characteristic for an analyte, the test element holder containing contact elements with contact areas opposing the contact areas of test element which enable electrical contact between the contact areas of the test element and the contact areas of the test element holder, wherein the contact areas of the test element comprise a material having a lower hardness than an electrically conductive material surface of the contact areas of the test element holder.

2. The test element analytical system of claim 1, wherein the contact areas of the test element holder are in the form of plug-in contacts, spring contacts or clip contacts.

3. The test element analytical system of claim 1, wherein the material surface is produced by coating a base material with an electrically conductive material.

4. The test element analytical system of claim 3, wherein additional intermediate layers are present between the base material and the material surface.

5. The test element analytical system of claim 4, wherein said intermediate layers comprise bonding layers or protecting layers.

6. The test element analytical system of claim 1, wherein the electrically conductive material surface comprises a material coating having a layer thickness of less than 2 μ

m.

7. The test element analytical system of claim 1, wherein the electrically conductive material surface comprises a material coating having a layer thickness of less than 1 μ

m.

8. The test element analytical system of claim 1, wherein the electrically conductive material surface comprises a material coating having a layer thickness of less than 500 nm.

9. The test element analytical system of claim 1, wherein the electrical transition resistance between the contact areas of the test element and the contact areas of the test element holder is less than 50 Ohm.

10. The test element analytical system of claim 1, wherein the sample is a body fluid.

11. The test element analytical system of claim 1, wherein the electrically conductive contact areas of the test element comprise electrodes and/or conductor paths.

12. The system of claim 1, wherein the system is configured so that the electrical contact is established by moving the contact areas of the test element in relation to the contact areas of the holder while in direct contact until a final position is reached.