Time to digital converter and applications thereof

• US 9,639,063 B2
• Filed: 08/05/2014
• Issued: 05/02/2017
• Est. Priority Date: 08/06/2013
• Status: Active Grant

• Current Assignee: STMicroelectronics Limited (STMicroelectronics NV)
• Original Assignee: STMicroelectronics Limited (STMicroelectronics NV)
• Inventors: Dutton, Neale, Henderson, Robert K., Gnecchi, Salvatore
• Primary Examiner(s): PYO, KEVIN K
• Application Number:
  US14/451,482
• Publication Number:
  US 20150041625A1
• Time in Patent Office: 1,001 Days
• Field of Search: 2502081, 250214 R, 341 94, 341118, 341160
• CPC Class Codes: G01S 17/10 using transmission of interrupted, pulse-modulated waves determination of distance by phase measurements G01S17/32
• CPC Class Codes: G01S 7/4865 Time delay measurement, e.g. time-of-flight measurement, time of arrival measurement or determining the exact position of a peak peak detection in noise, signal conditioning G01S7/487
• CPC Class Codes: G01T 1/248 Silicon photomultipliers [SiPM], e.g. an avalanche photodiode [APD] array on a common Si substrate
• CPC Class Codes: G01T 1/2985 In depth localisation, e.g. using positron emitters; Tomographic imaging (longitudinal and transverse section imaging; apparatus for radiation diagnosis sequentially in different planes, steroscopic radiation diagnosis); using external radiation sources A61B6/02
• CPC Class Codes: G04F 10/005 Time-to-digital converters [TDC] analog-to-digital converters with intermediate conversion to time or phase H03M1/50, H03M1/60

Abstract

A time to digital converter includes a sample module operable to sample an input signal at multiple different instances of time. A transition detection module, formed of comparison elements, processes the sampled input signal at successive time instances so as to detect transitions in the input signal in terms of time. An output module generates detected transitions in the input signal on multiple parallel outputs.

Claims

1. A time to digital converter, comprising:

a sampling module configured to sample an input signal at multiple different instances of time;

a transition detection module comprising a plurality of comparison elements, each comparison element configured to process the sampled input signal at successive instances of time so as to detect transitions in the input signal in terms of time;

an output module comprising multiple parallel outputs with each output operable to output a detection signal indicating a detected transition in the input signal; and

a counter circuit for each output of said multiple parallel outputs, wherein a value of each counter circuit is incremented in response to receipt of the detection signal.

2. The time to digital converter as claimed in claim 1, wherein each of said comparison elements comprises a two-input logic gate, each of its inputs being connected to a respective one of adjacent outputs of said sampling module.

3. The time to digital converter as claimed in claim 2, wherein each two-input logic gate comprises one of a two-input exclusive-OR gate or a two-input exclusive-NOR gate.

4. The time to digital converter as claimed in claim 1, further comprising a toggle module operable to toggle the input signal between two states on each occasion that a timing event is detected.

5. The time to digital converter as claimed in claim 4, wherein said toggle module comprises a T-type flip-flop.

6. The time to digital converter as claimed in claim 1, wherein said sampling module comprises a plurality of sample elements, each sample element being operable to sample the input signal at a different time instance.

7. The time to digital converter as claimed in claim 6, wherein each of said sample elements comprises one of a flip-flop or latch circuit.

8. The time to digital converter as claimed in claim 7, wherein said sample elements comprise D-type flip-flops.

9. The time to digital converter as claimed in claim 6, further comprising a delay module configured to receive the input signal and output in parallel multiple delayed versions of said input signal to said sampling module.

10. The time to digital converter as claimed in claim 9, wherein said delay module comprises a delay line having a plurality of delay elements.

11. The time to digital converter as claimed in claim 9, wherein each sample element is operable to receive one of said delayed versions of said input signal on its input, said sampling module configured to simultaneously sample each of said delayed versions of the signal received on the sample elements when clocked by a clock signal.

12. The time to digital converter as claimed in claim 6, further comprising a timing reference generation module configured to output multiple clock signals, each clock signal at a different phase;

each clock signal configured to clock one of said sample elements such that each sample element samples the input signal at a different clock phase.

13. The time to digital converter as claimed in claim 12, wherein said timing reference generation module comprises one of a phase-lock-loop or a delay-lock-loop.

14. The time to digital converter as claimed in claim 12, wherein the timing reference generation module comprises a resistor ladder ring on its output and a corresponding switching network, said resistor ladder ring providing additional clock phase outputs, said switching network configured to select between the clock phase outputs so as to increase the timing resolution of the timing reference generation module.

15. The time to digital converter as claimed in claim 12, wherein said output module is operable to sample the transitions detected in the preceding clock cycle.

16. The time to digital converter as claimed in claim 15, wherein said output module comprises further sample elements, each of said further sample elements configured to sample one of the signals output from the transition detection module when clocked by a respective one of said multiple clock signals.

17. The time to digital converter as claimed in claim 12, wherein said time to digital converter is of a folded design, wherein said comparison elements are arranged in a ring formation such that each input of each comparison elements is connected to a respective output of said sampling module and to an input of an adjacent comparison element.

18. The time to digital converter as claimed in claim 1, wherein the counter circuits together form a readout module operable to accumulate the transitions detected at each of said multiple outputs with the accumulated transitions producing a histogram.

19. A time to digital converter, comprising:

a sampling module configured to sample an input signal at multiple different instances of time;

a transition detection module comprising a plurality of comparison elements, each comparison element configured to process the sampled input signal at successive instances of time so as to detect transitions in the input signal in terms of time;

an output module comprising multiple parallel outputs operable to output detection signals indicating in parallel said detected transitions in the input signal, wherein each of said multiple parallel outputs comprises a synchronous pipelined shift register so as to increase the dynamic range of the time to digital converter.

20. The time to digital converter as claimed in claim 19, wherein each of said comparison elements comprises a two-input logic gate, each of its inputs being connected to a respective one of adjacent outputs of said sampling module.

21. The time to digital converter as claimed in claim 20, wherein each two-input logic gate comprises one of a two-input exclusive-OR gate or a two-input exclusive-NOR gate.

22. The time to digital converter as claimed in claim 19, further comprising a toggle module operable to toggle the input signal between two states on each occasion that a timing event is detected.

23. The time to digital converter as claimed in claim 22, wherein said toggle module comprises a T-type flip-flop.

24. The time to digital converter as claimed in claim 19, wherein said sampling module comprises a plurality of sample elements, each sample element being operable to sample the input signal at a different time instance.

25. The time to digital converter as claimed in claim 24, wherein each of said sample elements comprises one of a flip-flop or latch circuit.

26. The time to digital converter as claimed in claim 25, wherein said sample elements comprise D-type flip-flops.

27. The time to digital converter as claimed in claim 24, further comprising a delay module configured to receive the input signal and output in parallel multiple delayed versions of said input signal to said sampling module.

28. The time to digital converter as claimed in claim 27, wherein said delay module comprises a delay line having a plurality of delay elements.

29. The time to digital converter as claimed in claim 27, wherein each sample element is operable to receive one of said delayed versions of said input signal on its input, said sampling module configured to simultaneously sample each of said delayed versions of the signal received on the sample elements when clocked by a clock signal.

30. The time to digital converter as claimed in claim 24, further comprising a timing reference generation module configured to output multiple clock signals, each clock signal at a different phase;

each clock signal configured to clock one of said sample elements such that each sample element samples the input signal at a different clock phase.

31. The time to digital converter as claimed in claim 30, wherein said timing reference generation module comprises one of a phase-lock-loop or a delay-lock-loop.

32. The time to digital converter as claimed in claim 30, wherein the timing reference generation module comprises a resistor ladder ring on its output and a corresponding switching network, said resistor ladder ring providing additional clock phase outputs, said switching network configured to select between the clock phase outputs so as to increase the timing resolution of the timing reference generation module.

33. The time to digital converter as claimed in claim 30, wherein said output module is operable to sample the transitions detected in the preceding clock cycle.

34. The time to digital converter as claimed in claim 33, wherein said output module comprises further sample elements, each of said further sample elements configured to sample one of the signals output from the transition detection module when clocked by a respective one of said multiple clock signals.

35. The time to digital converter as claimed in claim 30, wherein said time to digital converter is of a folded design, wherein said comparison elements are arranged in a ring formation such that each input of each comparison elements is connected to a respective output of said sampling module and to an input of an adjacent comparison element.