×

Methods of forming replacement gate structures and bottom and top source/drain regions on a vertical transistor device

  • US 9,640,636 B1
  • Filed: 06/02/2016
  • Issued: 05/02/2017
  • Est. Priority Date: 06/02/2016
  • Status: Active Grant
First Claim
Patent Images

1. A method of forming a vertical transistor device, the method comprising:

  • forming an initial vertically oriented channel semiconductor structure having a first height above a substrate;

    forming a sacrificial spacer structure adjacent said initial vertically oriented channel semiconductor structure;

    with said sacrificial spacer structure in position, performing at least one process operation to define a self-aligned bottom source/drain region for said device that is self-aligned with respect to said sacrificial spacer structure;

    with said sacrificial spacer structure in position, forming an isolation region in said substrate;

    with said sacrificial spacer structure in position, forming a bottom source/drain electrode above said isolation region, wherein said bottom source/drain electrode is conductively coupled to said self-aligned bottom source/drain region;

    removing said sacrificial spacer structure; and

    forming a bottom spacer material around said initial vertically oriented channel semiconductor structure above said bottom source/drain electrode.

View all claims
  • 5 Assignments
Timeline View
Assignment View
    ×
    ×