Non-contact electromagnetic illuminated detection of part anomalies for cyber physical security

• US 9,642,014 B2
• Filed: 04/23/2015
• Issued: 05/02/2017
• Est. Priority Date: 06/09/2014
• Status: Active Grant

• Current Assignee: Nokomis Inc.
• Original Assignee: Nokomis Inc.
• Inventors: Keller, Walter John
• Primary Examiner(s): Moorthy, Aravind
• Application Number:
  US14/694,542
• Publication Number:
  US 20150358337A1
• Time in Patent Office: 740 Days
• Field of Search: 726 23, 713176, 713194
• CPC Class Codes: G06F 11/00 Error detection; Error correction; Monitoring error detection, correction or monitoring in information storage based on relative movement between record carrier and transducer G11B20/18; monitoring, i.e. supervising the progress of recording or reproducing G11B27/36; in static stores G11C29/00
• CPC Class Codes: G06F 21/56 Computer malware detection or handling, e.g. anti-virus arrangements
• CPC Class Codes: G06F 21/577 Assessing vulnerabilities and evaluating computer system security
• CPC Class Codes: G06F 21/73 by creating or determining hardware identification, e.g. serial numbers
• CPC Class Codes: G06F 2221/034 Test or assess a computer or a system
• CPC Class Codes: H04L 63/0876 based on the identity of the terminal or configuration, e.g. MAC address, hardware or software configuration or device fingerprint
• CPC Class Codes: H04W 12/128 Anti-malware arrangements, e.g. protection against SMS fraud or mobile malware
• CPC Class Codes: H04W 12/65 Environment-dependent, e.g. using captured environmental data

Abstract

An apparatus for testing, inspecting or screening an electronic device for electrical characteristics, modified or unmodified hardware, or firmware modifications including Malware, Trojans, improper versioning, and the like, includes a transmitting antenna positioned at a distance from the electronic device and a electromagnetic energy receiver or sensor for examining a resulting unintentional derived electromagnetic energy from the electronic device. The receiver collects unintentional RF energy components emitted by the device and includes a processor and executable instructions that perform analysis in a response to the acquired electromagnetic energy input. The characteristics of the collected RF energy may be compared with RF energy characteristics of an exemplary device. The analysis determines one of a modified, unmodified or score of certainty of discerned condition of the device.

Claims

1. An apparatus for determining a state and/or a condition of an unpowered electrical device, comprising:

a waveform generator generating a waveform;

a first antenna transmitting electromagnetic energy containing said waveform in a direction of the electrical device;

a second antenna receiving artifact(s) unintentionally re-emitted from the electrical device due to excitation thereof with said waveform;

one or more processors; and

non-transitory computer readable medium containing executable or computational instructions that cause said one or more processors to perform the steps of;

developing a signature of the electrical device, wherein

said signature contains said artifact(s),

analyzing said developed signature, and

determining the state and/or condition of the electrical device based on said artifact(s) present in said signature.

2. The apparatus of claim 1, further comprising a chamber and wherein the electrical device is disposed within said chamber during operation of said apparatus.

3. The apparatus of claim 2, wherein walls of said chamber are manufactured from an electrically conductive materials so as to shield the electrical device from external electromagnetic radiation.

4. The apparatus of claim 1, wherein said first and second antennas are integrated into a single antenna.

5. The apparatus of claim 4, wherein said single antenna is a horn shaped antenna and wherein said apparatus includes a base closing an open end of said horn shaped antenna and defining a chamber configured and sized to receive the electrical device therewithin during operation of said apparatus.

6. The apparatus of claim 5, further comprising a conveyor passing through said chamber so as to selectively position the electrical device within said chamber and remove the electrical device therefrom.

7. The apparatus of claim 1, further comprising a chamber, wherein the electrical device is disposed within said chamber during operation of said apparatus and wherein said first and second antennas are positioned within said chamber at different polarities relative to the electrical device.

8. The apparatus of claim 1, further comprising a chamber, wherein the electrical device is disposed within said chamber during operation of said apparatus and wherein each of said first and second antennas is an antenna array positioned on opposite walls of said chamber.

9. The apparatus of claim 1, wherein each of said first and second antennas is a horn-shaped antenna.

10. The apparatus of claim 9, wherein said first and second antennas are disposed opposite and in series with each other and wherein the electrical device is positioned between open ends of said first and second antennas.

11. The apparatus of claim 9, wherein said first and second antennas are disposed opposite and in series with each other, wherein open ends of said first and second antennas define a chamber and wherein said apparatus further includes a conveyor passing through said chamber so as to selectively position the electrical device within said chamber and remove the electrical device therefrom.

12. The apparatus of claim 1, wherein said waveform includes multiple frequencies.

13. The apparatus of claim 12, wherein said multiple frequencies are at least one of simultaneously and concurrently received at said second antenna and processed by said one or more processors.

14. The apparatus of claim 1, wherein said waveform is selected from a number of possible developed waveforms based on a type of the electrical device.

15. The apparatus of claim 1, wherein said artifact(s) includes a frequency shift.

16. The apparatus of claim 1, wherein said artifact(s) includes non-linear frequency features.

17. The apparatus of claim 1, further comprising a chamber, wherein the electrical device is oriented and located in space at a continuous variety of locations within said chamber.

18. The apparatus of claim 1, further comprising a chamber and a robotic or a manually adjustable arm mounted within said chamber.

19. The apparatus of claim 1, further comprising a multiplexer.

20. The apparatus of claim 19, wherein said multiplexer separates transmit frequencies from received frequencies.