System and method using OAM spectroscopy leveraging fractional orbital angular momentum as signature to detect materials

• US 9,645,083 B2
• Filed: 11/10/2016
• Issued: 05/09/2017
• Est. Priority Date: 07/24/2014
• Status: Active Grant

• Current Assignee: Nxgen Partners Ip, LLC (NxGen Partners LLC)
• Original Assignee: Nxgen Partners Ip, LLC (NxGen Partners LLC)
• Inventors: Ashrafi, Solyman, Linquist, Roger
• Primary Examiner(s): Stock, Jr., Gordon J
• Application Number:
  US15/348,608
• Publication Number:
  US 20170067827A1
• Time in Patent Office: 180 Days
• CPC Class Codes: A61B 5/14532 for measuring glucose, e.g. by tissue impedance measurement
• CPC Class Codes: A61B 5/1455 using optical sensors, e.g. spectral photometrical oximeters
• CPC Class Codes: G01N 2021/1765 Method using an image detector and processing of image signal
• CPC Class Codes: G01N 21/17 Systems in which incident light is modified in accordance with the properties of the material investigated where the material investigated is optically excited causing a change in wavelength of the incident light G01N21/63
• CPC Class Codes: G01N 21/21 Polarisation-affecting properties G01N21/19 takes precedence
• CPC Class Codes: G01N 21/59 Transmissivity G01N21/25 takes precedence
• CPC Class Codes: G01N 24/00 Investigating or analyzing materials by the use of nuclear magnetic resonance, electron paramagnetic resonance or other spin effects
• CPC Class Codes: G01N 24/08 by using nuclear magnetic resonance G01N24/12 takes precedence
• CPC Class Codes: G01N 33/483 Physical analysis of biological material
• CPC Class Codes: G01N 33/4833 of solid biological material, e.g. tissue samples, cell cultures tissue in vivo A61B5/00; cell suspensions G01N33/48735
• CPC Class Codes: G01N 33/487 of liquid biological material
• CPC Class Codes: G01R 33/3657 Decoupling of multiple RF coils wherein the multiple RF coils do not have the same function in MR, e.g. decoupling of a transmission coil from a receive coil
• CPC Class Codes: G01R 33/3692 involving signal transmission without using electrically conductive connections, e.g. wireless communication or optical communication of the MR signal or an auxiliary signal other than the MR signal

Abstract

An apparatus detects a material within a sample and includes signal generation circuitry that generates a first light beam having at least one orbital angular momentum applied thereto and applies the first beam to the sample. The orbital angular momentum imparts a phase factor of exp(imφ), where m is at least one of an integer value or fractional value and φ is the azimuth angle, to the first light beam. A detector receives the first light beam after the first light beam passes through the sample and detects the material responsive to a detection of a predetermined phase factor within the first light beam received from the sample.

Claims

1. An apparatus that detects a material within a sample, comprising:

signal generation circuitry that generates a first light beam having at least one orbital angular momentum applied thereto and applies the first light beam to the sample, the orbital angular momentum imparting a phase factor of exp(imφ

), where m is at least one of an integer value or fractional value and φ

is the azimuth angle, to the first light beam;

a detector for receiving the first light beam after the first light beam passes through the sample and detecting the material responsive to a detection of a predetermined phase factor within the first light beam received from the sample.

2. The apparatus of claim 1, wherein the predetermined phase factor further comprises the predetermined phase factor generated by the first light beam having fractional orbital angular momentum states applied thereto.

3. The apparatus of claim 1, wherein the signal generation circuitry further comprises:

an emitting source that emits the first light beam comprising a plurality of plane waves;

orbital angular momentum generation circuitry that receives the first light beam and applies the at least one orbital angular momentum to the plurality of plane waves of the first light beam.

4. The apparatus of claim 3, wherein the orbital angular momentum generation circuitry comprises a spiral phase plate having fraction step height to impart the at least one angular momentum to the first light beam.

5. The apparatus of claim 3, wherein the orbital angular momentum generation circuitry uses spatial holograms to impart orbital angular momentum to the first light beam.

6. The apparatus of claim 3, wherein the orbital angular momentum generation circuitry uses Laguerre-Gaussian optical pump pulses to impart orbital angular momentum to the first light beam.

7. The apparatus of claim 3, wherein the orbital angular generation circuitry uses a spatial light modulator generating Laguerre-Gaussian modes to impart the at least one orbital angular momentum to the first light beam.

8. The apparatus of claim 7, wherein the spatial light modulator limits Gouy phases in the first light beam to improve beam propagation stability.

9. The apparatus of claim 7, wherein the spatial light modulator is further programmed with a hologram that sets a phase structure and intensity structure for superimposing the Laguerre-Gaussian modes.

10. The apparatus of claim 9, wherein the hologram further includes a blazed grating to separate angularly a first fraction order of the at least one orbital angular momentum.

11. The apparatus of claim 1, wherein the applied orbital angular momentum includes a mh per photon along a beam axis of the first light beam.

12. A method for determining a material within a sample, comprising:

generating a first light beam having at least one orbital angular momentum applied thereto, the orbital angular momentum imparting a phase factor of exp(imφ

), where m is at least one of an integer value or fractional value and φ

is the azimuth angle, to the first light beam;

applying the first light beam to the sample;

receiving the first light beam after the first light beam passes through the sample;

detecting a predetermined phase factor within the received first light beam; and

determining the material within the sample based on the detected predetermined phase factor within the first light beam received from the sample.

13. The method of claim 12, wherein the predetermined phase factor further comprises the predetermined phase factor generated by the first light beam having fractional orbital angular momentum states applied thereto.

14. The method of claim 12, wherein the step of generating further comprises:

emitting the first light beam comprising a plurality of plane waves;

receiving the first light beam; and

applying the at least one orbital angular momentum to the plane waves of the first light beam.

15. The method of claim 14, wherein step of applying further comprises applying the at least one angular momentum to the first light beam using a spiral phase plate having a fraction step height.

16. The method of claim 14, wherein step of applying further comprises applying the at least one angular momentum to the first light beam using spatial holograms.

17. The method of claim 14, wherein step of applying further comprises applying the at least one angular momentum to the first light beam using Laguerre-Gaussian optical pump.

18. The method of claim 14, wherein step of applying further comprises applying the at least one angular momentum to the first light beam using a spatial light modulator generating Laguerre-Gaussian modes.

19. The method of claim 18, wherein the step of applying further comprises limiting Gouy phases in the first light beam to improve beam propagation stability with the spatial light modulator.

20. The method of claim 18, wherein the step of applying further comprises superimposing the Laguerre-Gaussian modes using a hologram programmed within the spatial light modulator that sets a phase structure and intensity.

21. The method of claim 20, wherein the step of superimposing further comprise programming the hologram to include a blazed grating to separate angularly a first fraction order of the at least one orbital angular momentum.

22. The method of claim 12, wherein the step of generating further comprises applying the at least one orbital angular momentum as a mℏ

per photon along a beam axis of the first light beam.