System and method using OAM spectroscopy leveraging fractional orbital angular momentum as signature to detect materials
First Claim
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1. An apparatus that detects a material within a sample, comprising:
- signal generation circuitry that generates a first light beam having at least one orbital angular momentum applied thereto and applies the first light beam to the sample, the orbital angular momentum imparting a phase factor of exp(imφ
), where m is at least one of an integer value or fractional value and φ
is the azimuth angle, to the first light beam;
a detector for receiving the first light beam after the first light beam passes through the sample and detecting the material responsive to a detection of a predetermined phase factor within the first light beam received from the sample.
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Abstract
An apparatus detects a material within a sample and includes signal generation circuitry that generates a first light beam having at least one orbital angular momentum applied thereto and applies the first beam to the sample. The orbital angular momentum imparts a phase factor of exp(imφ), where m is at least one of an integer value or fractional value and φ is the azimuth angle, to the first light beam. A detector receives the first light beam after the first light beam passes through the sample and detects the material responsive to a detection of a predetermined phase factor within the first light beam received from the sample.
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Citations
22 Claims
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1. An apparatus that detects a material within a sample, comprising:
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signal generation circuitry that generates a first light beam having at least one orbital angular momentum applied thereto and applies the first light beam to the sample, the orbital angular momentum imparting a phase factor of exp(imφ
), where m is at least one of an integer value or fractional value and φ
is the azimuth angle, to the first light beam;a detector for receiving the first light beam after the first light beam passes through the sample and detecting the material responsive to a detection of a predetermined phase factor within the first light beam received from the sample. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11)
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12. A method for determining a material within a sample, comprising:
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generating a first light beam having at least one orbital angular momentum applied thereto, the orbital angular momentum imparting a phase factor of exp(imφ
), where m is at least one of an integer value or fractional value and φ
is the azimuth angle, to the first light beam;applying the first light beam to the sample; receiving the first light beam after the first light beam passes through the sample; detecting a predetermined phase factor within the received first light beam; and determining the material within the sample based on the detected predetermined phase factor within the first light beam received from the sample. - View Dependent Claims (13, 14, 15, 16, 17, 18, 19, 20, 21, 22)
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Specification