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System and method using OAM spectroscopy leveraging fractional orbital angular momentum as signature to detect materials

  • US 9,645,083 B2
  • Filed: 11/10/2016
  • Issued: 05/09/2017
  • Est. Priority Date: 07/24/2014
  • Status: Active Grant
First Claim
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1. An apparatus that detects a material within a sample, comprising:

  • signal generation circuitry that generates a first light beam having at least one orbital angular momentum applied thereto and applies the first light beam to the sample, the orbital angular momentum imparting a phase factor of exp(imφ

    ), where m is at least one of an integer value or fractional value and φ

    is the azimuth angle, to the first light beam;

    a detector for receiving the first light beam after the first light beam passes through the sample and detecting the material responsive to a detection of a predetermined phase factor within the first light beam received from the sample.

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